Global Patent Index - EP 1352253 A2

EP 1352253 A2 20031015 - HIGH-FREQUENCY PROBE-TIP

Title (en)

HIGH-FREQUENCY PROBE-TIP

Title (de)

HOCHFREQUENZ-TASTSPITZE

Title (fr)

POINTE DE CONTACT HAUTE FREQUENCE

Publication

EP 1352253 A2 20031015 (DE)

Application

EP 01989385 A 20011206

Priority

  • DE 0104619 W 20011206
  • DE 20021685 U 20001221

Abstract (en)

[origin: WO0250556A2] The invention relates to a high-frequency probe-tip, in particular for printed circuit boards and/or HF cables. Said tip comprises a connection end (10), which connects a measuring cable to a measuring device, an earthing contact (16) and a measuring tip (12), on which at least one signal contact (14) is configured. A coaxial conductor (18) comprising an earthing conductor arrangement (20) and at least one signal conductor (22) that is surrounded by a dielectric (24) connects the connection end (10) to the measuring tip (12). Starting from the measuring tip (12) and extending over a predetermined area (30) of the high-frequency probe-tip, the earthing conductor arrangement (20) is configured in such a way that at least one of the signal conductors (22), together with the surrounding dielectric (24) can be displaced within the earthing conductor (20).

IPC 1-7

G01R 1/067

IPC 8 full level

G01R 1/073 (2006.01); G01R 1/067 (2006.01); H01R 11/18 (2006.01)

CPC (source: EP US)

G01R 1/06772 (2013.01 - EP US); H01R 11/18 (2013.01 - EP US)

Citation (search report)

See references of WO 0250556A2

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

DE 20021685 U1 20010315; CA 2420581 A1 20030225; CN 1466686 A 20040107; EP 1352253 A2 20031015; JP 2004537031 A 20041209; US 2004066181 A1 20040408; WO 0250556 A2 20020627; WO 0250556 A3 20021205

DOCDB simple family (application)

DE 20021685 U 20001221; CA 2420581 A 20011206; CN 01816197 A 20011206; DE 0104619 W 20011206; EP 01989385 A 20011206; JP 2002551603 A 20011206; US 45039403 A 20031124