EP 1364222 A1 20031126 - METHOD AND DEVICE FOR TESTING THE QUALITY OF PRINTED CIRCUITS
Title (en)
METHOD AND DEVICE FOR TESTING THE QUALITY OF PRINTED CIRCUITS
Title (de)
VERFAHREN UND VORRICHTUNG ZUR QUALITÄTSPRÜFUNG VON LEITERPLATTEN
Title (fr)
PROCEDE ET DISPOSITIF DE CONTROLE DE QUALITE SUR DES CARTES DE CIRCUITS IMPRIMES
Publication
Application
Priority
- DE 0200610 W 20020220
- DE 10108550 A 20010222
- DE 10113523 A 20010320
Abstract (en)
[origin: WO02067002A1] The invention relates to a method and to a device for testing electronic circuits or the parts thereof on printed circuits. The inventive method comprises the following steps: (a) detecting the radiation that is emitted by the surface of the printed circuit, (b) converting the detected radiation to data that represent a surface structure and/or depth structure of the printed circuit, (c) comparing the data of the surface structure and/or the depth structure with stored data of a desired state of the surface structure and/or depth structure, and (d) determining any deviations between the data of the detected surface structure and/or depth structure and the data of the desired state of the surface structure and/or depth structure.
IPC 1-7
IPC 8 full level
G01N 23/20 (2006.01); G01J 5/02 (2006.01); G01J 5/34 (2006.01); G01J 5/48 (2006.01); G01N 21/956 (2006.01); G01N 22/00 (2006.01); G01N 22/02 (2006.01); G01R 31/309 (2006.01); H05K 3/00 (2006.01)
CPC (source: EP US)
G01R 31/309 (2013.01 - EP US)
Citation (search report)
See references of WO 02067002A1
Designated contracting state (EPC)
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR
DOCDB simple family (publication)
WO 02067002 A1 20020829; BR 0207772 A 20040908; CA 2439167 A1 20020829; CN 1498346 A 20040519; DE 10290637 D2 20040415; EP 1364222 A1 20031126; JP 2004522967 A 20040729; US 2004164742 A1 20040826; US 6881595 B2 20050419
DOCDB simple family (application)
DE 0200610 W 20020220; BR 0207772 A 20020220; CA 2439167 A 20020220; CN 02806956 A 20020220; DE 10290637 T 20020220; EP 02714042 A 20020220; JP 2002566675 A 20020220; US 46871204 A 20040423