Global Patent Index - EP 1364399 A1

EP 1364399 A1 20031126 - SEMICONDUCTOR CHIP AND PRODUCTION METHOD FOR A HOUSING

Title (en)

SEMICONDUCTOR CHIP AND PRODUCTION METHOD FOR A HOUSING

Title (de)

HALBLEITERCHIP UND HERSTELLUNGSVERFAHREN FÜR EIN GEHÄUSE

Title (fr)

PUCE A SEMI-CONDUCTEUR ET PROCEDE DE PRODUCTION POUR UN BOITIER

Publication

EP 1364399 A1 20031126 (DE)

Application

EP 02714075 A 20020227

Priority

  • DE 0200714 W 20020227
  • DE 10109327 A 20010227

Abstract (en)

[origin: WO02069386A1] The invention relates to a selective covering, which covers the terminal contact surfaces (3, 4) and bonding wires (5) with a casting compound (8) and which leaves active areas exposed, particularly a contact area (6) for a finger in a fingerprint sensor. To this end, the chip surface is selectively adapted by the provision of a varying roughness or coating and/or the viscosity of the casting compound is modified by irradiating the same.

IPC 1-7

H01L 21/56

IPC 8 full level

H01L 23/28 (2006.01); G06K 9/00 (2006.01); H01L 21/56 (2006.01); H01L 23/31 (2006.01)

CPC (source: EP US)

G06V 40/1306 (2022.01 - EP US); H01L 21/56 (2013.01 - EP US); H01L 23/3121 (2013.01 - EP US); H01L 23/3157 (2013.01 - EP US); H01L 24/48 (2013.01 - EP US); H01L 2224/05554 (2013.01 - EP US); H01L 2224/05599 (2013.01 - EP US); H01L 2224/45099 (2013.01 - EP US); H01L 2224/48091 (2013.01 - EP US); H01L 2224/85399 (2013.01 - EP US); H01L 2224/8592 (2013.01 - EP US); H01L 2924/00014 (2013.01 - EP US); H01L 2924/01004 (2013.01 - EP US); H01L 2924/01068 (2013.01 - EP US); H01L 2924/14 (2013.01 - EP US); H01L 2924/181 (2013.01 - EP US)

Citation (search report)

See references of WO 02069386A1

Citation (examination)

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

WO 02069386 A1 20020906; DE 10109327 A1 20020912; EP 1364399 A1 20031126; IL 157598 A0 20040328; JP 2004521497 A 20040715; US 2004159961 A1 20040819; US 6876090 B2 20050405

DOCDB simple family (application)

DE 0200714 W 20020227; DE 10109327 A 20010227; EP 02714075 A 20020227; IL 15759802 A 20020227; JP 2002568412 A 20020227; US 64941003 A 20030827