Global Patent Index - EP 1392895 B1

EP 1392895 B1 20050803 - SEMI-INSULATING SILICON CARBIDE WITHOUT VANADIUM DOMINATION

Title (en)

SEMI-INSULATING SILICON CARBIDE WITHOUT VANADIUM DOMINATION

Title (de)

HALBISOLIERENDES SILICIUMCARBID OHNE VANADIUMDOMINANZ

Title (fr)

CARBURE DE SILICIUM SEMI-ISOLANT SANS DOMINATION DE VANADIUM

Publication

EP 1392895 B1 20050803 (EN)

Application

EP 02774112 A 20020523

Priority

  • US 0216274 W 20020523
  • US 86612901 A 20010525

Abstract (en)

[origin: US2001023945A1] A semi-insulating bulk single crystal of silicon carbide is disclosed that has a resistivity of at least 5000 OMEGA-cm at room temperature and a concentration of trapping elements that create states at least 700 meV from the valence or conduction band that is below the amounts that will affect the resistivity of the crystal, preferably below detectable levels. A method of forming the crystal is also disclosed, along with some resulting devices that take advantage of the microwave frequency capabilities of devices formed using substrates according to the invention.

IPC 1-7

C30B 1/00

IPC 8 full level

C30B 29/36 (2006.01); C30B 23/00 (2006.01); C30B 33/00 (2006.01); H01L 21/338 (2006.01); H01L 29/161 (2006.01); H01L 29/24 (2006.01); H01L 29/778 (2006.01); H01L 29/78 (2006.01); H01L 29/812 (2006.01)

CPC (source: EP KR US)

C30B 23/00 (2013.01 - EP US); C30B 29/36 (2013.01 - EP US); C30B 33/00 (2013.01 - EP US); H01L 29/1608 (2013.01 - EP US); H01L 29/78 (2013.01 - KR); H01L 31/0312 (2013.01 - KR); H01L 29/778 (2013.01 - EP US); H01L 29/78 (2013.01 - EP US); H01L 29/812 (2013.01 - EP US)

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

US 2001023945 A1 20010927; US 6396080 B2 20020528; AT E301205 T1 20050815; AU 2002344217 A1 20021209; CA 2446818 A1 20021205; CN 100483739 C 20090429; CN 1695253 A 20051109; DE 60205369 D1 20050908; DE 60205369 T2 20060524; EP 1392895 A2 20040303; EP 1392895 B1 20050803; ES 2243764 T3 20051201; JP 2005508821 A 20050407; JP 4309247 B2 20090805; KR 20040012861 A 20040211; WO 02097173 A2 20021205; WO 02097173 A3 20030417

DOCDB simple family (application)

US 86612901 A 20010525; AT 02774112 T 20020523; AU 2002344217 A 20020523; CA 2446818 A 20020523; CN 02810556 A 20020523; DE 60205369 T 20020523; EP 02774112 A 20020523; ES 02774112 T 20020523; JP 2003500330 A 20020523; KR 20037015400 A 20031125; US 0216274 W 20020523