EP 1395800 A1 20040310 - METHOD FOR DETERMINING TEMPERATURES ON SEMICONDUCTOR COMPONENTS
Title (en)
METHOD FOR DETERMINING TEMPERATURES ON SEMICONDUCTOR COMPONENTS
Title (de)
VERFAHREN ZUR BESTIMMUNG VON TEMPERATUREN AN HALBLEITERBAUELEMENTEN
Title (fr)
PROCEDE DE DETERMINATION DE TEMPERATURES SUR DES ELEMENTS A SEMI-CONDUCTEURS
Publication
Application
Priority
- DE 0201436 W 20020418
- DE 10119599 A 20010421
Abstract (en)
[origin: WO02086432A1] The aim of the invention is to determine a temperature on a semiconductor component (1). To this end, an inquiry light wave (7) is irradiated onto a measuring point located on the semiconductor component, a response light wave (8, 8') radiated by the measuring point is detected, and the temperature of the measuring point is determined on the basis of a temperature-dependent property (R) of the response light wave (8, 8').
IPC 1-7
IPC 8 full level
G01K 11/00 (2006.01)
CPC (source: EP US)
G01K 11/00 (2013.01 - EP US)
Citation (search report)
See references of WO 02086432A1
Designated contracting state (EPC)
AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR
DOCDB simple family (publication)
WO 02086432 A1 20021031; DE 10119599 A1 20021031; EP 1395800 A1 20040310; US 2003161380 A1 20030828; US 6953281 B2 20051011
DOCDB simple family (application)
DE 0201436 W 20020418; DE 10119599 A 20010421; EP 02740260 A 20020418; US 31195003 A 20030314