Global Patent Index - EP 1407220 A1

EP 1407220 A1 20040414 - INTERFEROMETER SYSTEM

Title (en)

INTERFEROMETER SYSTEM

Title (de)

INTERFEROMETERSYSTEM

Title (fr)

SYSTEME D'INTERFEROMETRE

Publication

EP 1407220 A1 20040414 (EN)

Application

EP 02747900 A 20020618

Priority

  • US 0218983 W 20020618
  • US 88329601 A 20010619
  • US 93408101 A 20010822

Abstract (en)

[origin: WO02103285A1] An interferometric measurement system capable of measuring tilt of a reflecting surface (26X, 26Y) with respect to a vertical axis (Z). The system preferably includes four laser beams (L1, L2, L3, L4) spaced at predetermined distances to measure distances between the measurement system and four locations on the reflecting surface. A controller (40) is also provided for receiving inputs from the measuring laser beams to mathematically determine a tilt of the location being measured.

IPC 1-7

G01B 9/02

IPC 8 full level

G01B 11/26 (2006.01); G01B 11/00 (2006.01); G03F 7/20 (2006.01)

CPC (source: EP)

G01B 11/002 (2013.01); G03F 7/70691 (2013.01)

Citation (search report)

See references of WO 02103285A1

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

WO 02103285 A1 20021227; EP 1407220 A1 20040414; JP 2004530888 A 20041007

DOCDB simple family (application)

US 0218983 W 20020618; EP 02747900 A 20020618; JP 2003505558 A 20020618