Global Patent Index - EP 1407489 A2

EP 1407489 A2 20040414 - DEVICE AND METHOD FOR MEASURING OPERATING TEMPERATURES OF AN ELECTRICAL COMPONENT

Title (en)

DEVICE AND METHOD FOR MEASURING OPERATING TEMPERATURES OF AN ELECTRICAL COMPONENT

Title (de)

VORRICHTUNG UND VERFAHREN ZUM MESSEN VON BETRIEBSTEMPERATUREN EINES ELEKTRISCHEN BAUTEILS

Title (fr)

PROCEDE ET DISPOSITIF POUR MESURER LES TEMPERATURES DE FONCTIONNEMENT D'UN COMPOSANT ELECTRIQUE

Publication

EP 1407489 A2 20040414 (DE)

Application

EP 02754223 A 20020618

Priority

  • DE 0202210 W 20020618
  • DE 10132452 A 20010704

Abstract (en)

[origin: WO03005442A2] The invention relates to a device and method for measuring operating temperatures Tj of a component, particularly transient temperatures Tj in the breakdown region of the component (2) during a breakdown operation. A measuring device, which measures the breakdown voltage Ud and the breakdown current I of the component (2) at a specified time ti during the breakdown operation, enables the component temperature Tj at time ti to be determined by comparing measurement data with previously recorded reference measurement data.

IPC 1-7

H01L 23/34

IPC 8 full level

G01R 31/27 (2006.01); G01R 31/26 (2014.01)

CPC (source: EP US)

G01R 31/275 (2013.01 - EP US); G01R 31/2603 (2013.01 - EP US); H01L 2924/0002 (2013.01 - EP US)

Citation (search report)

See references of WO 03005442A2

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

WO 03005442 A2 20030116; WO 03005442 A3 20031002; DE 10132452 A1 20030130; DE 10132452 B4 20050728; EP 1407489 A2 20040414; JP 2004534238 A 20041111; JP 4373206 B2 20091125; US 2004208227 A1 20041021; US 7121721 B2 20061017

DOCDB simple family (application)

DE 0202210 W 20020618; DE 10132452 A 20010704; EP 02754223 A 20020618; JP 2003511309 A 20020618; US 48176104 A 20040527