Global Patent Index - EP 1429227 A2

EP 1429227 A2 20040616 - Method for preventing tampering of a semiconductor integrated circuit

Title (en)

Method for preventing tampering of a semiconductor integrated circuit

Title (de)

Methode zur Verhinderung von Manipulation an einem Schaltkreis

Title (fr)

Méthode de protection d'un circuit intégré contre les infractions

Publication

EP 1429227 A2 20040616 (EN)

Application

EP 03257713 A 20031209

Priority

  • JP 2002362672 A 20021213
  • JP 2003323923 A 20030917

Abstract (en)

A semiconductor integrated circuit capable of protection from card hacking, by which erroneous actions are actively induced by irradiation with light and protected secret information is illegitimately acquired, is to be provided. Photodetectors, configured by a standard logic process, hardly distinguishable from other circuits and consumes very little standby power, are mounted on a semiconductor integrated circuit, such as an IC card microcomputer. Each of the photodetectors, for instance, has a configuration in which a first state is held in a static latch by its initializing action and reversal to a second state takes place when semiconductor elements in a state of non-conduction, constituting the static latch of the first state, is irradiated with light. A plurality of photodetectors are arranged in a memory cell array. By incorporating the static latch type photodetector into the memory array, they can be arranged inconspicuously. Reverse engineering by irradiation with light can be effectively prevented.

IPC 1-7

G06F 1/00

IPC 8 full level

G06F 12/14 (2006.01); G06F 21/00 (2006.01); G06F 21/06 (2006.01); G06F 21/10 (2013.01); G06F 21/75 (2013.01); G06F 21/86 (2013.01); G06K 19/073 (2006.01); G11C 11/41 (2006.01); G11C 16/02 (2006.01); G11C 17/08 (2006.01); H03K 17/78 (2006.01)

CPC (source: EP KR US)

G06K 19/073 (2013.01 - EP KR US); G06K 19/07372 (2013.01 - EP US); G11C 11/412 (2013.01 - EP US); G11C 11/4125 (2013.01 - EP US); H01L 23/576 (2013.01 - EP US); H01L 2924/0002 (2013.01 - EP US)

Designated contracting state (EPC)

DE FR GB IT NL

DOCDB simple family (publication)

EP 1429227 A2 20040616; EP 1429227 A3 20060125; EP 1429227 B1 20080213; DE 60319051 D1 20080327; DE 60319051 T2 20090205; JP 2004206680 A 20040722; JP 4497874 B2 20100707; KR 20040053803 A 20040624; TW 200419720 A 20041001; TW 201123354 A 20110701; TW I341569 B 20110501; TW I475644 B 20150301; US 2004120195 A1 20040624; US 2007189051 A1 20070816; US 2007189055 A1 20070816; US 2008031031 A1 20080207; US 2009224143 A1 20090910; US 2011168875 A1 20110714; US 7042752 B2 20060509; US 7295455 B2 20071113; US 7535744 B2 20090519; US 8488360 B2 20130716

DOCDB simple family (application)

EP 03257713 A 20031209; DE 60319051 T 20031209; JP 2003323923 A 20030917; KR 20030090210 A 20031211; TW 92134024 A 20031203; TW 99145882 A 20031203; US 201113051556 A 20110318; US 37825106 A 20060320; US 37827606 A 20060320; US 42280209 A 20090413; US 72547703 A 20031203; US 86791707 A 20071005