Global Patent Index - EP 1502308 A1

EP 1502308 A1 20050202 - ENHANCED CUTOFF FREQUENCY SILICON GERMANIUM TRANSISTOR

Title (en)

ENHANCED CUTOFF FREQUENCY SILICON GERMANIUM TRANSISTOR

Title (de)

SILIZIUM-GERMANIUM-TRANSISTOR MIT ERWEITERTER GRENZFREQUENZ

Title (fr)

TRANSISTOR AU GERMANIUM-SILICIUM A FREQUENCE DE COUPURE AMELIOREE

Publication

EP 1502308 A1 20050202 (EN)

Application

EP 02734064 A 20020426

Priority

US 0213315 W 20020426

Abstract (en)

[origin: WO03092079A1] A bipolar transistor for a small signal amplifier that has improved Early voltages, and hence enhanced cutoff frequency. The SiGe layer (14) has a thickness (t) and a Ge content that is greater than the stability limit. The misfit dislocations do not create appreciable charge trapping sites, and do not extend into the overlying base/collector junction, such that performance is improved without yield degradation.

IPC 1-7

H01L 31/0328

IPC 8 full level

H01L 21/331 (2006.01); H01L 29/10 (2006.01); H01L 29/737 (2006.01); H01L 31/0328 (2006.01)

CPC (source: EP KR)

H01L 29/1004 (2013.01 - EP); H01L 29/66242 (2013.01 - EP); H01L 29/73 (2013.01 - KR); H01L 29/737 (2013.01 - KR); H01L 29/7378 (2013.01 - EP); H01L 31/0328 (2013.01 - KR)

Designated contracting state (EPC)

AT BE CH CY DE DK ES FI FR GB GR IE IT LI LU MC NL PT SE TR

DOCDB simple family (publication)

WO 03092079 A1 20031106; AU 2002305254 A1 20031110; CN 1625811 A 20050608; EP 1502308 A1 20050202; EP 1502308 A4 20090318; JP 2005524233 A 20050811; JP 4223002 B2 20090212; KR 100754561 B1 20070905; KR 20040103974 A 20041209

DOCDB simple family (application)

US 0213315 W 20020426; AU 2002305254 A 20020426; CN 02828762 A 20020426; EP 02734064 A 20020426; JP 2004500339 A 20020426; KR 20047016720 A 20020426