Global Patent Index - EP 1506424 A1

EP 1506424 A1 20050216 - KEYHOLE ECHO-PLANAR IMAGING WITH DOUBLE (T1 AND T2*) CONTRAST (DC-EPIC)

Title (en)

KEYHOLE ECHO-PLANAR IMAGING WITH DOUBLE (T1 AND T2*) CONTRAST (DC-EPIC)

Title (de)

KEYHOLE-ECHOPLANARBILDGEBUNG MIT ZWEIFACHEM (T1- UND T2*-) KONTRAST (DC-EPIK)

Title (fr)

IMAGERIE ECHO-PLANAIRE EN TROU DE SERRURE A CONTRASTE DOUBLE (T1 ET T2*) (DC-EPIK)

Publication

EP 1506424 A1 20050216 (DE)

Application

EP 03735304 A 20030514

Priority

  • DE 0301547 W 20030514
  • DE 10221795 A 20020515

Abstract (en)

[origin: WO03098249A1] The invention relates to a method for examining at least one object during which properties of the object are detected at different times within a spatial frequency space formed by spatial frequencies. According to the invention, the method is carried out in such a manner that temporally consecutive recordings ensue in overlapping regions of the spatial frequency space and additionally in regions of the spatial frequency space that differ from one another.

IPC 1-7

G01R 33/561; G01R 33/50

IPC 8 full level

G01R 33/28 (2006.01); A61B 5/055 (2006.01); G01R 33/48 (2006.01); G01R 33/50 (2006.01); G01R 33/561 (2006.01)

CPC (source: EP US)

G01R 33/50 (2013.01 - EP US); G01R 33/561 (2013.01 - EP US); G01R 33/5616 (2013.01 - EP US)

Citation (search report)

See references of WO 03098249A1

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR

DOCDB simple family (publication)

WO 03098249 A1 20031127; DE 10221795 A1 20031204; DE 10221795 B4 20120426; EP 1506424 A1 20050216; JP 2005525204 A 20050825; US 2006091882 A1 20060504; US 7235972 B2 20070626

DOCDB simple family (application)

DE 0301547 W 20030514; DE 10221795 A 20020515; EP 03735304 A 20030514; JP 2004505718 A 20030514; US 51480105 A 20050808