Global Patent Index - EP 1547145 A2

EP 1547145 A2 20050629 - METHOD FOR THE PRODUCTION OF A COMPOSITE SICOI-TYPE SUBSTRATE COMPRISING AN EPITAXY STAGE

Title (en)

METHOD FOR THE PRODUCTION OF A COMPOSITE SICOI-TYPE SUBSTRATE COMPRISING AN EPITAXY STAGE

Title (de)

HERSTELLUNGSVERFAHREN EINES SICOI-SUBSTRATS MIT EINEM EPITAXIESCHRITT

Title (fr)

PROCEDE DE FABRICATION D' UN SUBSTRAT COMPOSITE DU TYPE SiCOI COMPRENANT UNE ETAPE D' EPITAXIE

Publication

EP 1547145 A2 20050629 (FR)

Application

EP 03780258 A 20030901

Priority

  • FR 0350044 W 20030901
  • FR 0210884 A 20020903

Abstract (en)

[origin: FR2844095A1] Fabrication of a composite SiCOI substrate comprises the provision of an initial substrate incorporating a support (1) of Si or SiC supporting a layer (2) of SiO2 carrying a thin film (3) of SiC and the epitaxy of SiC (4) on the thin film of SiC. The epitaxy is realised at the following temperatures: (a) from 1450 degrees C to obtain an epitaxy of polytype 6H or 4H on a carried thin film of polytype 6H or 4H respectively, if the support is of SiC; (b) from 1350 degrees C to obtain an epitaxy of polytype 3C on a carried thin layer of polytype 3C, if the support is of Si or SiC; (c) from 1350 degrees C to obtain an epitaxy of polytype 6H or 4H on a carried thin film of polytype 6H or 4H respectively, if the support is of Si. An Independent claim is also included for a semiconductor device produced on a composite SiCOI substrate obtained.

IPC 1-7

H01L 21/76

IPC 8 full level

H01L 29/872 (2006.01); C30B 25/02 (2006.01); C30B 29/36 (2006.01); H01L 21/02 (2006.01); H01L 21/20 (2006.01); H01L 21/205 (2006.01); H01L 21/336 (2006.01); H01L 21/338 (2006.01); H01L 21/76 (2006.01); H01L 27/12 (2006.01); H01L 29/47 (2006.01); H01L 29/786 (2006.01); H01L 29/812 (2006.01); H01L 29/861 (2006.01)

CPC (source: EP US)

C30B 25/02 (2013.01 - EP US); C30B 29/36 (2013.01 - EP US); H01L 21/02378 (2013.01 - EP US); H01L 21/02433 (2013.01 - EP US); H01L 21/02447 (2013.01 - EP US); H01L 21/02529 (2013.01 - EP US); H01L 21/2007 (2013.01 - EP US); H01L 21/7602 (2013.01 - EP US)

Citation (search report)

See references of WO 2004027844A2

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR

DOCDB simple family (publication)

FR 2844095 A1 20040305; FR 2844095 B1 20050128; EP 1547145 A2 20050629; JP 2005537678 A 20051208; TW 200416878 A 20040901; US 2006125057 A1 20060615; WO 2004027844 A2 20040401; WO 2004027844 A3 20040521

DOCDB simple family (application)

FR 0210884 A 20020903; EP 03780258 A 20030901; FR 0350044 W 20030901; JP 2004537240 A 20030901; TW 92124198 A 20030902; US 52665705 A 20050302