Global Patent Index - EP 1565729 A2

EP 1565729 A2 20050824 - MEASURING DEVICE FOR THE OPTICAL ANALYSIS OF A TEST STRIP

Title (en)

MEASURING DEVICE FOR THE OPTICAL ANALYSIS OF A TEST STRIP

Title (de)

MESSEINRICHTUNG ZUR OPTISCHEN UNTERSUCHUNG EINES TESTELEMENTS

Title (fr)

DISPOSITIF DE MESURE POUR L'EXAMEN OPTIQUE D'UN L MENT D'ESSAI

Publication

EP 1565729 A2 20050824 (DE)

Application

EP 03767543 A 20031114

Priority

  • DE 10254685 A 20021122
  • EP 0312724 W 20031114

Abstract (en)

[origin: WO2004048881A2] The invention relates to a measuring device for the optical analysis of a diagnostic test strip (10). Said device comprises a light source (16), a photo-detector (24) and a device (12) for positioning the test strip (10) between the light source (16) and the photo-detector (24). The light source (16) comprises one or more organic light-emitting diodes (OLEDs) and the OLEDs (14) form a composite structure with imaging optics (20) and/or the photo-detector (24) by means of a support substrate (18).

IPC 1-7

G01N 21/86; G01N 33/487

IPC 8 full level

G01N 21/86 (2006.01)

CPC (source: EP US)

G01N 21/8483 (2013.01 - EP US); H10K 65/00 (2023.02 - EP US); G01N 2201/0628 (2013.01 - EP US)

Citation (search report)

See references of WO 2004048881A2

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PT RO SE SI SK TR

DOCDB simple family (publication)

WO 2004048881 A2 20040610; WO 2004048881 A3 20041104; WO 2004048881 A8 20050825; WO 2004048881 A8 20051013; WO 2004048881 A8 20051222; AU 2003292018 A1 20040618; AU 2003292018 A8 20040618; CA 2506790 A1 20040610; DE 10254685 A1 20040603; EP 1565729 A2 20050824; JP 2006507494 A 20060302; US 2006098203 A1 20060511; US 7460222 B2 20081202

DOCDB simple family (application)

EP 0312724 W 20031114; AU 2003292018 A 20031114; CA 2506790 A 20031114; DE 10254685 A 20021122; EP 03767543 A 20031114; JP 2004554347 A 20031114; US 53564705 A 20050929