GPI coverage and content

You can use Global Patent Index (GPI) to carry out detailed searches in the EPO's worldwide bibliographic (DOCDB), legal event (INPADOC) and full-text data sets, and download or visualise the search results for statistical analysis.

Current content: 157 484 516 patent documents

This week's update (26/07/2024 12:00 CET):

147 225 new documents added

921 612 documents amended

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EP 1573308 A1 20050914 - DIELECTROPHORETIC PARTICLE PROFILING SYSTEM AND METHOD

Title (en)

DIELECTROPHORETIC PARTICLE PROFILING SYSTEM AND METHOD

Title (de)

SYSTEM UND VERFAHREN FÜR DIE PROFILIERUNG DIELEKTROPHORETISCHER PARTIKEL

Title (fr)

SYSTEME ET PROCEDE DE DEFINITION DE PROFILS DIELECTROPHORETIQUES DE PARTICULES

Publication

EP 1573308 A1 20050914 (EN)

Application

EP 02794251 A 20021212

Priority

US 0239931 W 20021212

IPC 1-7

G01N 27/26; G01N 27/447

IPC 8 full level

G01N 27/26 (2006.01); G01N 27/447 (2006.01)

Citation (search report)

See references of WO 2004055505A1

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR IE IT LI LU MC NL PT SE SI SK TR

DOCDB simple family (publication)

AU 2002359698 A1 20040709; EP 1573308 A1 20050914; JP 2006510020 A 20060323

DOCDB simple family (application)

AU 2002359698 A 20021212; EP 02794251 A 20021212; JP 2004560251 A 20021212