Global Patent Index - EP 1601932 A2

EP 1601932 A2 20051207 - METHOD FOR MEASUREMENT OF THREE-DIMENSIONAL OBJECTS BY SINGLE-VIEW BACKLIT SHADOWGRAPHY

Title (en)

METHOD FOR MEASUREMENT OF THREE-DIMENSIONAL OBJECTS BY SINGLE-VIEW BACKLIT SHADOWGRAPHY

Title (de)

VERFAHREN ZUR MESSUNG DREIDIMENSIONALER OBJEKTE MIT OPTISCHER SCHATTENPROJEKTION AUS EINER EINZIGEN ANSICHT

Title (fr)

PROCEDE DE MESURE D'OBJETS TRIDIMENSIONNELS PAR OMBROSCOPIE OPTIQUE A UNE SEULE VUE

Publication

EP 1601932 A2 20051207 (FR)

Application

EP 04718994 A 20040310

Priority

  • FR 2004050099 W 20040310
  • FR 0350045 A 20030312

Abstract (en)

[origin: FR2852389A1] The method involves determining an optical characteristic of an object. An optical model of visible light propagation across the object is established, where the model has an equation that connects a geometrical parameter of the object to result of an observation made directly on an image of the object. The image is acquired and an observation is performed for determining geometrical parameters of the object.

IPC 1-7

G01B 11/08

IPC 8 full level

G01B 11/06 (2006.01); G01B 11/08 (2006.01)

CPC (source: EP US)

G01B 11/06 (2013.01 - EP US); G01B 11/08 (2013.01 - EP US)

Citation (search report)

See references of WO 2004083772A2

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR

DOCDB simple family (publication)

FR 2852389 A1 20040917; FR 2852389 B1 20050513; AU 2004221630 A1 20040930; AU 2004221630 B2 20091126; CA 2518702 A1 20040930; CA 2518702 C 20130604; CN 100376865 C 20080326; CN 1759298 A 20060412; EP 1601932 A2 20051207; JP 2006519990 A 20060831; US 2006215180 A1 20060928; US 7307740 B2 20071211; WO 2004083772 A2 20040930; WO 2004083772 A3 20041111

DOCDB simple family (application)

FR 0350045 A 20030312; AU 2004221630 A 20040310; CA 2518702 A 20040310; CN 200480006584 A 20040310; EP 04718994 A 20040310; FR 2004050099 W 20040310; JP 2006505848 A 20040310; US 54778305 A 20050906