Global Patent Index - EP 1622743 A2

EP 1622743 A2 20060208 - WHOLE-SUBSTRATE SPECTRAL IMAGING SYSTEM FOR CMP

Title (en)

WHOLE-SUBSTRATE SPECTRAL IMAGING SYSTEM FOR CMP

Title (de)

GANZSUBSTRATSPEKTRALABBILDUNGSSYSTEM FÜR CMP

Title (fr)

SYSTEME D'IMAGERIE SPECTRALE DE SUBSTRAT ENTIER POUR PLANARISATION CHIMICO-MECANIQUE (CMP)

Publication

EP 1622743 A2 20060208 (EN)

Application

EP 04758852 A 20040401

Priority

  • US 2004010326 W 20040401
  • US 45987603 P 20030401
  • US 46944903 P 20030505

Abstract (en)

[origin: WO2004090502A2] Systems of and methods for capturing a plurality of one-dimensional images representative of substantially all of the surface of a substrate within a single revolution of a rotating platen holding a polishing pad in operative contact with the surface of the substrate during chemical-mechanical planarization. A two-dimensional image comprising frame data, which may comprise a spectral image, is derived from the plurality of one-dimensional images. The frame data provides information useful for subsequent chemical-mechanical processing of the substrate.

IPC 1-7

B24B 1/00; B24B 49/00; B24B 51/00

IPC 8 full level

B24B 37/013 (2012.01); B24B 49/12 (2006.01)

CPC (source: EP US)

B24B 37/013 (2013.01 - EP US); B24B 49/12 (2013.01 - EP US)

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR

DOCDB simple family (publication)

WO 2004090502 A2 20041021; WO 2004090502 A3 20050120; EP 1622743 A2 20060208; EP 1622743 A4 20070404; JP 2006522493 A 20060928; US 2004259472 A1 20041223

DOCDB simple family (application)

US 2004010326 W 20040401; EP 04758852 A 20040401; JP 2006509672 A 20040401; US 81555504 A 20040401