EP 1630856 A4 20100616 - MUTILAYER FILM REFLECTOR AND X-RAY EXPOSURE SYSTEM
Title (en)
MUTILAYER FILM REFLECTOR AND X-RAY EXPOSURE SYSTEM
Title (de)
MEHRSCHICHTFILMREFLEKTOR UND RÖNTGENBESTRAHLUNGSSYSTEM
Title (fr)
REFLECTEUR A FILMS MULTICOUCHE ET SYSTEME D'EXPOSITION AUX RAYONS X
Publication
Application
Priority
- JP 2004007410 W 20040524
- JP 2003156212 A 20030602
- JP 2004045771 A 20040223
Abstract (en)
[origin: EP1630856A1] The present invention makes it possible to obtain a multilayer film reflective mirror 61 comprising a first multilayer film 67 which is formed by alternately laminating Mo layers 671 and Si layers 673 on a substrate 63, and a second multilayer film 65 which is formed on top of the first multilayer film 67, and which is formed by alternately laminating Mo layers 651 and Si layers 653, wherein the thickness of the Mo layers in the first multilayer film is substantially equal to or smaller than the thickness of the Mo layers in the second multilayer film, and the ratio of the thickness of the Mo layers to the thickness of the Si layers in the first multilayer film is different from the ratio of these thicknesses in the second multilayer film. As a result, a multilayer film reflective mirror with a low internal stress in which a drop in the reflectivity is suppressed can be obtained.
IPC 8 full level
H01L 21/027 (2006.01); G02B 5/08 (2006.01); G03F 1/24 (2012.01); G03F 1/68 (2012.01); G03F 7/20 (2006.01); G21K 1/06 (2006.01); H01L 21/033 (2006.01)
CPC (source: EP US)
B82Y 10/00 (2013.01 - EP US); B82Y 40/00 (2013.01 - EP US); G03F 1/24 (2013.01 - EP US); G03F 7/70233 (2013.01 - EP US); G03F 7/70958 (2013.01 - EP US); G21K 1/062 (2013.01 - EP US); G21K 2201/067 (2013.01 - EP US); H01L 21/0332 (2013.01 - EP US)
Citation (search report)
- [ADP] ZOETHOUT E ET AL: "Stress mitigation in Mo/Si multilayers for EUV lithography", PROCEEDINGS OF THE SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING SPIE-INT. SOC. OPT. ENG USA LNKD- DOI:10.1117/12.490138, vol. 5037, 16 June 2003 (2003-06-16), pages 872 - 878, XP002580101, ISSN: 0277-786X
- [XOI] SHIRAISHI M; KANDAKA N; MURAKAMI K: "Mo/Si multilayers deposited by low-pressure rotary magnet cathode sputtering for extreme-ultraviolet lithography", EMERGING LITHOGRAPHIC TECHNOLOGIES VII 25-27 FEB. 2003 SANTA CLARA, CA, USA, 25 February 2003 (2003-02-25) - 27 February 2003 (2003-02-27) & SHIRAISHI M ET AL: "Mo/Si multilayers deposited by low-pressure rotary magnet cathode sputtering for extreme-ultraviolet lithography", PROCEEDINGS OF THE SPIE - THE INTERNATIONAL SOCIETY FOR OPTICAL ENGINEERING SPIE-INT. SOC. OPT. ENG USA LNKD- DOI:10.1117/12.484436, vol. 5037, 16 June 2003 (2003-06-16), pages 249 - 256, XP009132887, ISSN: 0277-786X
- See references of WO 2004109778A1
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR
DOCDB simple family (publication)
EP 1630856 A1 20060301; EP 1630856 A4 20100616; EP 1630856 B1 20120613; EP 2490227 A1 20120822; EP 2490227 B1 20141119; EP 2854159 A1 20150401; EP 2854159 B1 20180620; EP 3389056 A1 20181017; JP 4356696 B2 20091104; JP WO2004109778 A1 20060720; US 2006062348 A1 20060323; US 7203275 B2 20070410; WO 2004109778 A1 20041216
DOCDB simple family (application)
EP 04734613 A 20040524; EP 12167832 A 20040524; EP 14186179 A 20040524; EP 18168175 A 20040524; JP 2004007410 W 20040524; JP 2005506748 A 20040524; US 27261005 A 20051114