Global Patent Index - EP 1648974 A4

EP 1648974 A4 20080423 - SLURRIES AND METHODS FOR CHEMICAL-MECHANICAL PLANARIZATION OF COPPER

Title (en)

SLURRIES AND METHODS FOR CHEMICAL-MECHANICAL PLANARIZATION OF COPPER

Title (de)

AUFSCHLÄMMUNGEN UND VERFAHREN ZUR CHEMISCH-MECHANISCHEN PLANARISIERUNG VON KUPFER

Title (fr)

SUSPENSIONS AQUEUSES ET PROCEDES POUR LA PLANARISATION CHIMICO-MECANIQUE DU CUIVRE

Publication

EP 1648974 A4 20080423 (EN)

Application

EP 04779276 A 20040727

Priority

  • US 2004024143 W 20040727
  • US 63169803 A 20030730
  • US 84671804 A 20040513

Abstract (en)

[origin: WO2005012451A2] The claimed invention involves a novel aqueous slurry for chemical-mechanical planarization that is effective for polishing copper at high polish rates. The aqueous slurry according to the present invention comprises particles of MoO2 or MoO3 and an oxidizing agent. A method for polishing copper by chemical-mechanical planarization includes contacting copper with a polishing pad and an aqueous slurry comprising particles Of MoO2 or MoO3 and an oxidizing agent.

IPC 8 full level

C09G 1/02 (2006.01); B24B 1/00 (2006.01); C01G 39/02 (2006.01); C09G 1/04 (2006.01); C09K 3/14 (2006.01); C23F 3/04 (2006.01); C23F 3/06 (2006.01); H01L 21/321 (2006.01)

CPC (source: EP KR)

C09G 1/02 (2013.01 - EP); C09K 3/1409 (2013.01 - EP); C09K 3/1463 (2013.01 - EP); C23F 3/06 (2013.01 - EP); H01L 21/304 (2013.01 - KR); H01L 21/3212 (2013.01 - EP)

Citation (search report)

Citation (examination)

  • FAYOLLE M ET AL: "Copper CMP evaluation: planarization issues", MICROELECTRONIC ENGINEERING, ELSEVIER PUBLISHERS BV., AMSTERDAM, NL, vol. 37-38, 1 November 1997 (1997-11-01), pages 135 - 141, XP004103556, ISSN: 0167-9317, DOI: 10.1016/S0167-9317(97)00104-4
  • LEE E H ET AL: "The oxidative-dissolution behaviors of fission products in a Na2CO3â H2O2 solution", JOURNAL OF RADIOANALYTICAL AND NUCLEAR CHEMISTRY, KLUWER ACADEMIC PUBLISHERS, DO, vol. 281, no. 3, 2 July 2009 (2009-07-02), pages 339 - 346, XP019751193, ISSN: 1588-2780, DOI: 10.1007/S10967-009-0018-6

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR

Designated extension state (EPC)

AL HR LT LV MK

DOCDB simple family (publication)

WO 2005012451 A2 20050210; WO 2005012451 A3 20060518; EP 1648974 A2 20060426; EP 1648974 A4 20080423; JP 2007500943 A 20070118; KR 20060118396 A 20061123

DOCDB simple family (application)

US 2004024143 W 20040727; EP 04779276 A 20040727; JP 2006521994 A 20040727; KR 20067000223 A 20060104