EP 1670028 B1 20170208 - Apparatus for automatically correcting a charged-particle beam
Title (en)
Apparatus for automatically correcting a charged-particle beam
Title (de)
Apparat zur automatischen Korrektur eines Strahls geladener Teilchen
Title (fr)
Dispositif pour la correction d'un faisceau de particules chargées
Publication
Application
Priority
JP 2004354143 A 20041207
Abstract (en)
[origin: EP1670028A2] There is disclosed a method and apparatus for automatically correcting a charged-particle beam (2) with an aberration corrector (6) without the operator performing manual operations. The apparatus has an extraction portion (11b) for extracting the profile (13) of the beam from images of a surface of a sample (5), a calculation unit (11c) for calculating the amount of axial deviation of the apparatus from the position of the extracted profile of the beam, and a feedback unit (11d) for automatically applying feedback to the aberration corrector or to the objective lens (4) according to the calculated amount of axial deviation.
IPC 8 full level
H01J 37/153 (2006.01); H01J 37/28 (2006.01)
CPC (source: EP US)
H01J 37/153 (2013.01 - EP US); H01J 37/28 (2013.01 - EP US); H01J 2237/1501 (2013.01 - EP US)
Citation (examination)
- KRIVANEK O L ET AL: "ABERRATION CORRECTION IN THE STEM", INSTITUTE OF PHYSICS CONFERENCE SERIES, IOP PUBLISHING, GB, 1 January 1997 (1997-01-01), pages 35 - 40, XP000789996, ISSN: 0951-3248
- HAIDER M ET AL: "A SPHERICAL-ABERRATION-CORRECTED 200 KV TRANSMISSION ELECTRON MICROSCOPE", ULTRAMICROSCOPY, ELSEVIER, AMSTERDAM, NL, vol. 75, 1 October 1998 (1998-10-01), pages 53 - 60, XP000791003, ISSN: 0304-3991, DOI: 10.1016/S0304-3991(98)00048-5
Designated contracting state (EPC)
CZ DE FR GB NL
DOCDB simple family (publication)
EP 1670028 A2 20060614; EP 1670028 A3 20140430; EP 1670028 B1 20170208; US 2006169895 A1 20060803; US 7355175 B2 20080408
DOCDB simple family (application)
EP 05257415 A 20051201; US 29384605 A 20051202