Global Patent Index - EP 1682868 A1

EP 1682868 A1 20060726 - METHODS AND DEVICES FOR ANALYSING A DEFORMABLE OBJECT

Title (en)

METHODS AND DEVICES FOR ANALYSING A DEFORMABLE OBJECT

Title (de)

VERFAHREN UND VORRICHTUNGEN ZUR UNTERSUCHUNG EINES DEFORMIERBAREN OBJEKTS

Title (fr)

PROCEDE ET DISPOSITIFS POUR EXAMINER UN OBJET DEFORMABLE

Publication

EP 1682868 A1 20060726 (DE)

Application

EP 04797789 A 20041110

Priority

  • EP 2004012741 W 20041110
  • DE 10352416 A 20031110

Abstract (en)

[origin: WO2005045400A1] The invention relates to methods for analysing at least one deformable object (O) in a liquid suspension, comprising the steps: generation of an electric positioning field and positioning of the object (O) in a minimum potential of the positioning field; generation of an electric deformation field in such a way that a deformation force is exerted on the object (O); and detection of at least one dielectric, geometric or optical characteristic of said object (O). According to the invention, the positioning field is generated in a compartment (12) of a fluidic microsystem (10) and the positioning of the object (O) in a freely suspended state takes place in a contactless manner. The invention also relates to measuring apparatus that is used to carry out said method.

IPC 8 full level

G01N 15/14 (2006.01); G01L 1/24 (2006.01)

CPC (source: EP US)

B01L 3/502761 (2013.01 - EP US); G01N 15/1023 (2024.01 - EP US); G01N 15/1456 (2013.01 - EP US); B01L 2200/0652 (2013.01 - EP US); B01L 2200/0668 (2013.01 - EP US); B01L 2300/0816 (2013.01 - EP US); B01L 2400/0415 (2013.01 - EP US); B01L 2400/0424 (2013.01 - EP US); G01N 15/1459 (2013.01 - EP US); G01N 2015/1022 (2024.01 - EP US); G01N 2015/1495 (2013.01 - EP US); G01N 2015/1497 (2013.01 - EP US)

Citation (search report)

See references of WO 2005045400A1

Citation (examination)

SCHNELLE T.H. ET AL: "Paired microelectrode system: dielectrophoretic particle sorting and force calibration", JOURNAL OF ELECTROSTATICS, vol. 47, 15 December 1998 (1998-12-15) - 22 February 1999 (1999-02-22), pages 121 - 132, XP004179202

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LU MC NL PL PT RO SE SI SK TR

DOCDB simple family (publication)

WO 2005045400 A1 20050519; DE 10352416 A1 20050616; DE 10352416 B4 20051020; EP 1682868 A1 20060726; US 2007119714 A1 20070531

DOCDB simple family (application)

EP 2004012741 W 20041110; DE 10352416 A 20031110; EP 04797789 A 20041110; US 59577104 A 20041110