Global Patent Index - EP 1751530 A2

EP 1751530 A2 20070214 - DEVICE AND METHOD FOR ANALYTE MEASUREMENT

Title (en)

DEVICE AND METHOD FOR ANALYTE MEASUREMENT

Title (de)

VORRICHTUNG, SYSTEM UND VERFAHREN FÜR ANALYTMESSUNGEN

Title (fr)

DISPOSITIF ET PROCEDE DE MESURE D'ANALYTES

Publication

EP 1751530 A2 20070214 (EN)

Application

EP 05762856 A 20050524

Priority

  • IB 2005002351 W 20050524
  • US 57403604 P 20040524
  • US 57699404 P 20040603
  • US 57703404 P 20040603

Abstract (en)

[origin: WO2005121759A2] A method is provided for analyte measurement using an analyte measuring device. The method comprises providing a substrate with at least one electrode; and covering at least the electrode with a layer containing zwitterionic compound and/or having the zwitterionic compound in a mediator layer to enable the analyte measuring device when coupled to a meter to generate a signal to noise ratio selected from one from of the following: better than 20, better than 50, better than 200, or better than 1000.

IPC 8 full level

C12Q 1/00 (2006.01); G01N 27/00 (2006.01); G01N 27/30 (2006.01); G01N 33/487 (2006.01)

CPC (source: EP)

G01N 27/3272 (2013.01)

Citation (search report)

See references of WO 2005121759A2

Designated contracting state (EPC)

DE GB IT

DOCDB simple family (publication)

WO 2005121759 A2 20051222; WO 2005121759 A3 20060427; EP 1751530 A2 20070214

DOCDB simple family (application)

IB 2005002351 W 20050524; EP 05762856 A 20050524