EP 1760457 A3 20091118 - Method and a system for calibrating a measuring apparatus
Title (en)
Method and a system for calibrating a measuring apparatus
Title (de)
Verfahren und eine Anordnung zum Kalibrieren einer Messanordnung
Title (fr)
Procédé et dispositif destinés au calibrage d'un système de mesure
Publication
Application
Priority
DE 102005033187 A 20050713
Abstract (en)
[origin: DE102005033187A1] The method involves penetrating an invasive radiation into a calibrating object and detecting resulting radiation of a detection unit (3) of a measuring arrangement. A radiographic image of the object is produced from detection signals that correspond to the detected radiation. A geometry parameter of a geometrical model, which describes geometry of the arrangement, is determined by evaluation of the radiographic image. Independent claims are also included for the following: (1) a calibrating object for calibrating a measuring arrangement (2) an arrangement for calibrating a measuring arrangement comprising a calibrating object.
IPC 8 full level
G01N 23/04 (2006.01)
CPC (source: EP)
G01N 23/046 (2013.01); G01T 1/169 (2013.01); G01N 2223/419 (2013.01)
Citation (search report)
- [XY] EP 1414004 A1 20040428 - ISO SCIENCE LAB INC [US]
- [XY] US 2004034298 A1 20040219 - JOHNSON BROOKS A [US], et al
- [XY] US 5149965 A 19920922 - MARKS LLOYD A [US]
- [X] US 2005094771 A1 20050505 - BASU SAMIT K [US], et al
- [Y] WO 2005018456 A1 20050303 - KONINKL PHILIPS ELECTRONICS NV [NL], et al
- [A] US 2004252811 A1 20041216 - MORITA HISANORI [JP], et al
- [A] DE 19819928 A1 19991111 - PHILIPS PATENTVERWALTUNG [DE]
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR
Designated extension state (EPC)
AL BA HR MK RS
DOCDB simple family (publication)
DE 102005033187 A1 20070125; EP 1760457 A2 20070307; EP 1760457 A3 20091118; EP 1760457 B1 20130529
DOCDB simple family (application)
DE 102005033187 A 20050713; EP 06076408 A 20060712