Global Patent Index - EP 1761744 A1

EP 1761744 A1 20070314 - METHOD AND ARRANGEMENT FOR CORRECTING AN ANGLE-MEASURING AND/OR DISTANCE-MEASURING SENSOR SYSTEM

Title (en)

METHOD AND ARRANGEMENT FOR CORRECTING AN ANGLE-MEASURING AND/OR DISTANCE-MEASURING SENSOR SYSTEM

Title (de)

VERFAHREN UND ANORDNUNG ZUR KORREKTUR EINES WINKEL- UND/ODER ABSTANDSMESSENDEN SENSORSYSTEMS

Title (fr)

PROCEDE ET DISPOSITIF POUR CORRIGER UN SYSTEME DE DETECTION MESURANT UN ANGLE ET/OU UNE DISTANCE

Publication

EP 1761744 A1 20070314 (DE)

Application

EP 05747518 A 20050427

Priority

  • EP 2005051888 W 20050427
  • DE 102004029815 A 20040619

Abstract (en)

[origin: WO2005124286A1] Disclosed are a method and an arrangement for correcting an angle-measuring and/or distance-measuring sensor system (1), in which sinusoidal or cosinusoidal test signals (xi, yi) obtained by scanning a moved test object (2) are evaluated. In order to correct the angle errors and/or phase errors of the test signals (xi, yi), the inventive method comprises a balancing process and a subsequent correction process. Correction parameters (m1, m2) are provided in the balancing process while a pair of corrected measured values (xi, yi) are determined from each pair of measured values (xi, yi) in the correction process.

IPC 8 full level

G01D 5/244 (2006.01)

CPC (source: EP US)

G01D 5/2448 (2013.01 - EP US); G01D 5/2449 (2013.01 - EP US); G01D 18/001 (2021.05 - EP US)

Citation (search report)

See references of WO 2005124286A1

Designated contracting state (EPC)

DE ES FR GB IT

DOCDB simple family (publication)

WO 2005124286 A1 20051229; AU 2005255137 A1 20051229; AU 2005255137 B2 20100617; DE 102004029815 A1 20060105; EP 1761744 A1 20070314; US 2007174015 A1 20070726; US 7620514 B2 20091117

DOCDB simple family (application)

EP 2005051888 W 20050427; AU 2005255137 A 20050427; DE 102004029815 A 20040619; EP 05747518 A 20050427; US 58753605 A 20050427