Global Patent Index - EP 1775544 A1

EP 1775544 A1 20070418 - Inspection table

Title (en)

Inspection table

Title (de)

Kontrolltisch

Title (fr)

Table d examination

Publication

EP 1775544 A1 20070418 (EN)

Application

EP 05022122 A 20051011

Priority

EP 05022122 A 20051011

Abstract (en)

The invention relates to an inspection table (11) for flexible quality inspection of objects in production or assembly lines. The inspection table has at least one area (8, 10) on which objects to be inspected and related inspection sensors (2, 4) are placed, wherein the inspection sensors are freely positionable with respect to the objects to be inspected and fixed in position by quick-fixing means (1, 3).

IPC 8 full level

G01B 5/00 (2006.01); A47B 37/00 (2006.01); B25H 1/02 (2006.01)

CPC (source: EP)

B25H 1/02 (2013.01)

Citation (search report)

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

Designated extension state (EPC)

AL BA HR MK YU

DOCDB simple family (publication)

EP 1775544 A1 20070418; EP 1775544 B1 20080910; AT E408118 T1 20080915; DE 602005009710 D1 20081023

DOCDB simple family (application)

EP 05022122 A 20051011; AT 05022122 T 20051011; DE 602005009710 T 20051011