EP 1777490 A3 20130605 - Methods and apparatus for inspecting an object using structured light
Title (en)
Methods and apparatus for inspecting an object using structured light
Title (de)
Verfahren und Vorrichtung zur Untersuchung eines Objektes mittels strukturierten Lichts
Title (fr)
Procédé et appareil pour l'inspection d'un objet avec de la lumière structurée
Publication
Application
Priority
US 25718205 A 20051024
Abstract (en)
[origin: EP1777490A2] A method and apparatus for inspecting an object (12) using a light measurement system (10) that includes a light source (22) and an imaging sensor (24). This includes emitting light from the light source, dispersing light emitted from the light source into one of a diffraction pattern and an interference pattern, and imaging the patterned light onto the object using a lens (38).
IPC 8 full level
G01B 11/25 (2006.01)
CPC (source: EP US)
G01B 11/2513 (2013.01 - EP US)
Citation (search report)
- [XI] US 4294544 A 19811013 - ALTSCHULER BRUCE R, et al
- [I] JP H05164522 A 19930629 - FANUC LTD
- [XI] JP H04243213 A 19920831 - FUJITSU LTD
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR
Designated extension state (EPC)
AL BA HR MK RS
DOCDB simple family (publication)
EP 1777490 A2 20070425; EP 1777490 A3 20130605; CN 1955720 A 20070502; CN 1955720 B 20101215; JP 2007121292 A 20070517; US 2007091302 A1 20070426; US 7492450 B2 20090217
DOCDB simple family (application)
EP 06255432 A 20061023; CN 200610164124 A 20061024; JP 2006287189 A 20061023; US 25718205 A 20051024