Global Patent Index - EP 1784500 A1

EP 1784500 A1 20070516 - METHOD FOR THE ANALYSIS OF POINT MUTATIONS

Title (en)

METHOD FOR THE ANALYSIS OF POINT MUTATIONS

Title (de)

VERFAHREN ZUM ANALYSIEREN VON PUNKTMUTATIONEN

Title (fr)

PROCEDE D'ANALYSE DE MUTATIONS PONCTUELLES

Publication

EP 1784500 A1 20070516 (DE)

Application

EP 04764692 A 20040901

Priority

EP 2004009730 W 20040901

Abstract (en)

[origin: WO2006024314A1] The invention relates to a method for determining point mutations by means of DNA microarrays and TIRF excitation. According to said method, bonding of nucleic acids to short DNA probes on a microarray is measured at different temperatures. Melting point curves are generated from the measured values and the difference in the melting point curves between the probe for the wild-type DNA and the probe for the corresponding mutated DNA is generated. The position of said curves makes it possible to unambiguously decide whether the point mutation is a homozygous DNA or a heterozygous DNA and what type of homozygosity it is.

IPC 8 full level

C12Q 1/68 (2006.01)

CPC (source: EP US)

C12Q 1/6827 (2013.01 - EP US); G01N 21/648 (2013.01 - EP US); G01N 21/7703 (2013.01 - EP US)

Citation (search report)

See references of WO 2006024314A1

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IT LI LU MC NL PL PT RO SE SI SK TR

DOCDB simple family (publication)

WO 2006024314 A1 20060309; EP 1784500 A1 20070516; US 2008085839 A1 20080410

DOCDB simple family (application)

EP 2004009730 W 20040901; EP 04764692 A 20040901; US 66156304 A 20040901