Global Patent Index - EP 1817745 A1

EP 1817745 A1 20070815 - METHOD FOR DETERMINING INFORMATION ON A HEAT-EXPOSED DEVICE

Title (en)

METHOD FOR DETERMINING INFORMATION ON A HEAT-EXPOSED DEVICE

Title (de)

VERFAHREN ZUM ERMITTELN EINER INFORMATION ÜBER EINE EINER TEMPERATUR AUSGESETZTEN VORRICHTUNG

Title (fr)

PROCEDE POUR DETERMINER UNE INFORMATION CONCERNANT UN DISPOSITIF SOUMIS A UNE TEMPERATURE

Publication

EP 1817745 A1 20070815 (DE)

Application

EP 05797195 A 20051011

Priority

  • EP 2005055153 W 20051011
  • DE 102004050769 A 20041016

Abstract (en)

[origin: WO2006040316A1] The invention relates to a method for determining information on a heat-exposed device (1) which makes it possible to reliably and simply determine information of the device (1) deterioration. For this purpose, the device temperature is detected, at least one meter (5, 10) is incriminated according to an attainable temperature or temperature change. Information on the device (1) deterioration is determined according to the meter state.

IPC 8 full level

G07C 3/00 (2006.01); G01M 99/00 (2011.01)

CPC (source: EP US)

G07C 3/04 (2013.01 - EP US)

Citation (search report)

See references of WO 2006040316A1

Designated contracting state (EPC)

DE FR

DOCDB simple family (publication)

DE 102004050769 A1 20060420; CN 100530246 C 20090819; CN 101036167 A 20070912; DE 502005010698 D1 20110127; EP 1817745 A1 20070815; EP 1817745 B1 20101215; JP 2008517258 A 20080522; JP 4709845 B2 20110629; US 2008060428 A1 20080313; US 7628535 B2 20091208; WO 2006040316 A1 20060420

DOCDB simple family (application)

DE 102004050769 A 20041016; CN 200580034281 A 20051011; DE 502005010698 T 20051011; EP 05797195 A 20051011; EP 2005055153 W 20051011; JP 2007536164 A 20051011; US 66543405 A 20051011