EP 1831892 A1 20070912 - SYSTEM FOR PERFORMING FAST TESTING DURING FLASH REFERENCE CELL SETTING
Title (en)
SYSTEM FOR PERFORMING FAST TESTING DURING FLASH REFERENCE CELL SETTING
Title (de)
SYSTEM ZUR DURCHFÜHRUNG VON SCHNELLTESTS WÄHREND DER EINSTELLUNG VON FLASH-REFERENZZELLEN
Title (fr)
SYSTEME POUR LA REALISATION D'ESSAI RAPIDE LORS DU REGLAGE DE CELLULES DE REFERENCE DE MEMOIRE FLASH
Publication
Application
Priority
- US 2005042083 W 20051118
- IT MI20042473 A 20041223
- US 8926805 A 20050324
Abstract (en)
[origin: WO2006071402A1] An embedded circuit (14) in a memory device (10) is used in place of an external test device to perform time-consuming tasks such as voltage verification during the setting of reference cells (20). An external test device (16) programs at least one reference cell (22) to a predetermined value. The embedded circuit uses the cell (22) programmed by the external device as a comparative reference to program additional reference cells (20).
IPC 8 full level
G11C 7/14 (2006.01)
CPC (source: EP)
G11C 7/14 (2013.01); G11C 16/28 (2013.01); G11C 29/24 (2013.01); G11C 29/50004 (2013.01); G11C 16/04 (2013.01); G11C 2029/4002 (2013.01)
Designated contracting state (EPC)
DE FR GB
DOCDB simple family (publication)
WO 2006071402 A1 20060706; EP 1831892 A1 20070912; EP 1831892 A4 20090610
DOCDB simple family (application)
US 2005042083 W 20051118; EP 05848820 A 20051118