EP 1844344 A1 20071017 - METHOD AND SYSTEM FOR TESTING OR MEASURING ELECTRICAL ELEMENTS, USING TWO OFFSET PULSES
Title (en)
METHOD AND SYSTEM FOR TESTING OR MEASURING ELECTRICAL ELEMENTS, USING TWO OFFSET PULSES
Title (de)
VERFAHREN UND SYSTEM ZUM TESTEN ODER MESSEN ELEKTRISCHER ELEMENTE MIT ZWEI VERSETZTEN IMPULSEN
Title (fr)
PROCEDE ET SYSTEME DE TEST OU DE MESURE D'ELEMENTS ELECTRIQUES, AU MOYEN DE DEUX IMPULSIONS DECALEES
Publication
Application
Priority
- FR 2006000154 W 20060124
- FR 0501099 A 20050204
Abstract (en)
[origin: WO2006082293A1] The invention concerns a method for testing electrical elements (2-1) including steps which consist in: applying a first beam of particles (4-1) to a first location (3-1) of an electrical element, to release the electrons from the first location, applying a second beam of particles (4-2) to a second location (3-2) of an electrical element, with a temporal offset (?t) non-null relative to the application of the first beam of particles (4-1), to release electrons of the second location, collecting the electrons released under the effect of the first and second beams of particles, and measuring at least one amount of electric charges corresponding to the collection of electrons released under the effect of the second beam of particles, and deducing therefrom quantitatively or qualitatively one electrical characteristic of the electrical element.
IPC 8 full level
G01R 31/308 (2006.01); G01R 31/305 (2006.01)
CPC (source: EP KR US)
G01R 31/28 (2013.01 - KR); G01R 31/305 (2013.01 - EP KR US); G01R 31/308 (2013.01 - EP US); B82Y 10/00 (2013.01 - KR); G01R 31/307 (2013.01 - EP US); G01R 31/311 (2013.01 - EP US)
Citation (search report)
See references of WO 2006082293A1
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR
DOCDB simple family (publication)
FR 2881834 A1 20060811; FR 2881834 B1 20070511; CN 101116002 A 20080130; EP 1844344 A1 20071017; JP 2008529022 A 20080731; KR 20070104453 A 20071025; TW 200643448 A 20061216; US 2008006427 A1 20080110; WO 2006082293 A1 20060810
DOCDB simple family (application)
FR 0501099 A 20050204; CN 200680004084 A 20060124; EP 06709153 A 20060124; FR 2006000154 W 20060124; JP 2007553640 A 20060124; KR 20077020185 A 20070903; TW 95103182 A 20060126; US 83339207 A 20070803