Global Patent Index - EP 1845836 A1

EP 1845836 A1 20071024 - METHOD FOR USING A WAVEFRONT ABERROMETER

Title (en)

METHOD FOR USING A WAVEFRONT ABERROMETER

Title (de)

VERFAHREN ZUM EINSATZ EINES WELLENFRONTABERROMETERS

Title (fr)

UTILISATION D'UN ABERROMETRE A ANALYSE DU FRONT D'ONDE

Publication

EP 1845836 A1 20071024 (EN)

Application

EP 05731055 A 20050330

Priority

  • US 2005010672 W 20050330
  • US 5470005 A 20050210

Abstract (en)

[origin: WO2006085889A1] A method of using a wavefront aberrometer to orient an artificial lens having a major axis of symmetry for implantation into an eye, including activating a wavefront aberrometer and generating a map of the aberration patterns of an eye. Next, a major axis of symmetry of the aberration pattern of the eye is identified. The major axis of symmetry of the artificial lens is likewise identified and the two major axes of symmetry are aligned. The artificial lens is then implanted into the eye with the axes of symmetry still aligned.

IPC 8 full level

A61B 3/00 (2006.01); A61F 2/16 (2006.01)

CPC (source: EP)

A61F 2/1637 (2013.01); A61F 2/1624 (2013.01)

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU MC NL PL PT RO SE SI SK TR

DOCDB simple family (publication)

WO 2006085889 A1 20060817; EP 1845836 A1 20071024; EP 1845836 A4 20090429

DOCDB simple family (application)

US 2005010672 W 20050330; EP 05731055 A 20050330