Global Patent Index - EP 1845836 A1

EP 1845836 A1 2007-10-24 - METHOD FOR USING A WAVEFRONT ABERROMETER

Title (en)

METHOD FOR USING A WAVEFRONT ABERROMETER

Title (de)

VERFAHREN ZUM EINSATZ EINES WELLENFRONTABERROMETERS

Title (fr)

UTILISATION D'UN ABERROMETRE A ANALYSE DU FRONT D'ONDE

Publication

EP 1845836 A1 (EN)

Application

EP 05731055 A

Priority

  • US 2005010672 W
  • US 5470005 A

Abstract (en)

[origin: WO2006085889A1] A method of using a wavefront aberrometer to orient an artificial lens having a major axis of symmetry for implantation into an eye, including activating a wavefront aberrometer and generating a map of the aberration patterns of an eye. Next, a major axis of symmetry of the aberration pattern of the eye is identified. The major axis of symmetry of the artificial lens is likewise identified and the two major axes of symmetry are aligned. The artificial lens is then implanted into the eye with the axes of symmetry still aligned.

IPC 8 full level (invention and additional information)

A61B 3/00 (2006.01); A61F 2/16 (2006.01)

CPC (invention and additional information)

A61F 2/1637 (2013.01); A61F 9/013 (2013.01)

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU MC NL PL PT RO SE SI SK TR

EPO simple patent family

WO 2006085889 A1 20060817; EP 1845836 A1 20071024; EP 1845836 A4 20090429

INPADOC legal status


2009-07-29 [18W] WITHDRAWN

- Effective date: 20090618

2009-04-29 [A4] SUPPLEMENTARY SEARCH REPORT

- Effective date: 20090330

2008-05-14 [DAX] REQUEST FOR EXTENSION OF THE EUROPEAN PATENT (TO ANY COUNTRY) DELETED

2007-10-24 [17P] REQUEST FOR EXAMINATION FILED

- Effective date: 20070816

2007-10-24 [AK] DESIGNATED CONTRACTING STATES:

- Kind Code of Ref Document: A1

- Designated State(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU MC NL PL PT RO SE SI SK TR