Global Patent Index - EP 1867219 B1

EP 1867219 B1 20081001 - ARRANGEMENT FOR MONITORING THERMAL SPRAY PROCESSES

Title (en)

ARRANGEMENT FOR MONITORING THERMAL SPRAY PROCESSES

Title (de)

ANORDNUNG ZUR ÜBERWACHUNG THERMISCHER SPRITZPROZESSE

Title (fr)

SYSTEME DE SURVEILLANCE DE PROCESSUS DE PULVERISATION THERMIQUE

Publication

EP 1867219 B1 20081001 (DE)

Application

EP 06722707 A 20060330

Priority

  • DE 2006000555 W 20060330
  • DE 102005016189 A 20050408

Abstract (en)

[origin: WO2006105762A2] The invention relates to an arrangement for measuring characteristic properties of a plasma beam in a thermal spray process, said arrangement comprising means for introducing spray materials into the plasma, a one-dimensional or two-dimensional array consisting of first optical waveguides (2a) for receiving the light radiation emitted by the plasma (1), and other optical waveguides (2b, 2c) for distributing the light radiation emitted by the plasma (1). According to the invention, means (W) are provided for splitting the light guided in the first optical waveguides (2a) into the other optical waveguides (2b, 2c), one optical waveguide (2c) being connected to the opening diaphragm of a particle flow arrangement (7), and the other optical waveguide (2b) being connected to the opening diaphragm of a spectrometer (3). Means (5, 7) are also provided for determining the current state of the spray process.

IPC 8 full level

H05H 1/00 (2006.01)

CPC (source: EP US)

H05H 1/0025 (2013.01 - EP US); H05H 1/0037 (2013.01 - EP US)

Designated contracting state (EPC)

DE FR GB

DOCDB simple family (publication)

WO 2006105762 A2 20061012; WO 2006105762 A3 20070419; DE 102005016189 A1 20061012; DE 502006001690 D1 20081113; EP 1867219 A2 20071219; EP 1867219 B1 20081001; US 2009051915 A1 20090226; US 7688441 B2 20100330

DOCDB simple family (application)

DE 2006000555 W 20060330; DE 102005016189 A 20050408; DE 502006001690 T 20060330; EP 06722707 A 20060330; US 88779706 A 20060330