Global Patent Index - EP 1875197 A2

EP 1875197 A2 20080109 - DEVICE AND METHOD FOR MULTIPARAMETRIC ANALYSIS OF MICROSCOPIC ELEMENTS

Title (en)

DEVICE AND METHOD FOR MULTIPARAMETRIC ANALYSIS OF MICROSCOPIC ELEMENTS

Title (de)

VORRICHTUNG UND VERFAHREN ZUR MEHRFACHPARAMETERANALYSE MIKROSKOPISCHER ELEMENTE

Title (fr)

DISPOSITIF ET PROCEDE D'ANALYSE MULTIPARAMETRIQUE D'ELEMENTS MICROSCOPIQUES

Publication

EP 1875197 A2 20080109 (FR)

Application

EP 06743693 A 20060414

Priority

  • FR 2006000819 W 20060414
  • FR 0504005 A 20050421

Abstract (en)

[origin: WO2006111641A2] The invention concerns a device (DA) for analyzing microscopic elements, comprising firstly a measuring space (CM) for microscopic elements to be analyzed, secondly at least one source (S) delivering conjugated rays at the measuring space (CM), having at least two different analyzing wavelengths and designed to interact with the microscopic elements in the measuring space (CM) to form interacting rays, thirdly coding means (M) for encoding the rays upstream of the measuring space (CM) with different codes, fourthly optical filtering means (FO) for selectively filtering the interacting rays of fluorescence and/or diffusion depending on their wavelength, fifthly detecting means (DE, DF) for transforming into electric signals part at least of the interacting rays from the measuring space (CM), and sixthly analyzing means (MA) including decoding means (DRE, DRF) for decoding the electric signals to enable data representing the analyzed microscopic elements to be determined.

IPC 8 full level

G01N 15/02 (2006.01)

CPC (source: EP KR US)

G01N 15/02 (2013.01 - KR); G01N 15/14 (2013.01 - KR); G01N 15/147 (2013.01 - EP US); G01N 21/6428 (2013.01 - EP US); G01N 15/1434 (2013.01 - EP US); G01N 15/149 (2024.01 - EP US); G01N 2015/1477 (2013.01 - EP US); G01N 2015/1486 (2013.01 - EP US); G01N 2015/1493 (2013.01 - EP US); G01N 2021/6419 (2013.01 - EP US); G01N 2021/6421 (2013.01 - EP US)

Citation (search report)

See references of WO 2006111641A2

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

DOCDB simple family (publication)

WO 2006111641 A2 20061026; WO 2006111641 A3 20070104; CN 101194159 A 20080604; CN 101194159 B 20120502; EP 1875197 A2 20080109; FR 2884920 A1 20061027; FR 2884920 B1 20070810; JP 2008537136 A 20080911; KR 20080007473 A 20080121; US 2008283754 A1 20081120; US 7777869 B2 20100817

DOCDB simple family (application)

FR 2006000819 W 20060414; CN 200680020823 A 20060414; EP 06743693 A 20060414; FR 0504005 A 20050421; JP 2008507118 A 20060414; KR 20077027024 A 20071120; US 91205506 A 20060414