EP 1889083 A2 20080220 - DEVICE, SYSTEM AND METHOD FOR TESTING AND ANALYSING INTEGRATED CIRCUITS
Title (en)
DEVICE, SYSTEM AND METHOD FOR TESTING AND ANALYSING INTEGRATED CIRCUITS
Title (de)
EINRICHTUNG, SYSTEM UND VERFAHREN ZUM PRÜFEN UND ANALYSIEREN INTEGRIERTER SCHALTUNGEN.
Title (fr)
DISPOSITIF, SYSTEME ET PROCEDE POUR TESTER ET ANALYSER DES CIRCUITS INTEGRES
Publication
Application
Priority
- IB 2006051493 W 20060512
- EP 05104556 A 20050527
- EP 06744921 A 20060512
Abstract (en)
[origin: WO2006126130A2] This invention relates to a semiconductor device for testing and analyzing integrated circuits (1) on a first side and a second side. The semiconductor device (1) having a first surface (Al) and a second surface (A2) both sides having a set of contacts (P3a, P3b, P3a', P3b'). The sets of contacts on are symmetrically located on positions relative to a first fictitious plane of symmetry (Sl) and a second fictitious plane of symmetry (S2). The semiconductor device (1) has at least a first position of use and a second position of use, whereby the second position of use is obtained by rotating the semiconductor device (1) in the first position of use 180° around a fictitious axis (M). This axis (M) is defined by the crossing of the first fictitious plane of symmetry (Sl) and the second fictitious plane of symmetry (S2). The semiconductor device thus obtained provides a flexible and generic solution for testing and analyzing integrated circuits on both sides.
IPC 8 full level
G01R 31/28 (2006.01)
CPC (source: EP US)
G01R 31/2887 (2013.01 - EP US); G01R 31/2889 (2013.01 - EP US)
Citation (search report)
See references of WO 2006126130A2
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR
DOCDB simple family (publication)
WO 2006126130 A2 20061130; WO 2006126130 A3 20070308; AT E448486 T1 20091115; CN 101248362 A 20080820; DE 602006010371 D1 20091224; EP 1889083 A2 20080220; EP 1889083 B1 20091111; JP 2008542709 A 20081127; TW 200702687 A 20070116; US 2009212796 A1 20090827; US 8203356 B2 20120619
DOCDB simple family (application)
IB 2006051493 W 20060512; AT 06744921 T 20060512; CN 200680018641 A 20060512; DE 602006010371 T 20060512; EP 06744921 A 20060512; JP 2008512978 A 20060512; TW 95118460 A 20060524; US 91465806 A 20060512