Global Patent Index - EP 1899750 B1

EP 1899750 B1 20131002 - METHODS AND APPARATUS FOR E-BEAM SCANNING

Title (en)

METHODS AND APPARATUS FOR E-BEAM SCANNING

Title (de)

VERFAHREN UND VORRICHTUNG FÜR ELEKTRONENSTRAHLABTASTUNG

Title (fr)

PROCEDES ET DISPOSITIF DE BALAYAGE PAR FAISCEAU D'ELECTRONS

Publication

EP 1899750 B1 20131002 (EN)

Application

EP 06800017 A 20060705

Priority

  • US 2006026486 W 20060705
  • US 69666905 P 20050705

Abstract (en)

[origin: WO2007006042A2] In one aspect, an x-ray scanning device is provided. The x-ray scanning device comprises a target adapted to convert electron-beam (e-beam) energy into x-ray energy, a detector array positioned to detect at least some x-rays emitted from the target, and a conveyer mechanism adapted to convey items to be inspected through an inspection region formed by the target and the detector array, wherein the target and the detector array are rotated out of alignment with each other such that x-rays emitted from the target impinge on diametrically positioned detectors of the detector array without passing through near-side detectors of the detector array.

IPC 8 full level

G01V 5/00 (2006.01)

CPC (source: EP US)

G01N 23/2252 (2013.01 - EP US); G01V 5/22 (2024.01 - EP US); H01J 35/14 (2013.01 - EP US); H05G 1/52 (2013.01 - EP US); H05G 1/70 (2013.01 - EP US); H01J 2235/068 (2013.01 - EP US)

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR

DOCDB simple family (publication)

WO 2007006042 A2 20070111; WO 2007006042 A3 20070607; WO 2007006042 A9 20070405; EP 1899750 A2 20080319; EP 1899750 B1 20131002; EP 2392947 A2 20111207; EP 2392947 A3 20140212; US 2007081623 A1 20070412; US 2010316188 A1 20101216; US 2012170714 A1 20120705; US 7428297 B2 20080923; US 8155272 B2 20120410

DOCDB simple family (application)

US 2006026486 W 20060705; EP 06800017 A 20060705; EP 11172895 A 20060705; US 19158708 A 20080814; US 201213413038 A 20120306; US 48132206 A 20060705