Global Patent Index - EP 1934578 A1

EP 1934578 A1 20080625 - METHOD FOR EXAMINING A MEASUREMENT OBJECT, AND APPARATUS

Title (en)

METHOD FOR EXAMINING A MEASUREMENT OBJECT, AND APPARATUS

Title (de)

VERFAHREN ZUM UNTERSUCHEN EINES MESSOBJEKTES UND VORRICHTUNG

Title (fr)

PROCEDE D'ANALYSE D'UN OBJET A MESURER, ET DISPOSITIF CORRESPONDANT

Publication

EP 1934578 A1 20080625 (DE)

Application

EP 06761735 A 20060630

Priority

  • DE 2006001131 W 20060630
  • DE 102005049562 A 20051013

Abstract (en)

[origin: WO2007041976A1] The invention relates to a method for examining a measurement object (2, 12), in which the measurement object (2, 12) is examined by means of scanning probe microscopy using a measurement probe (10) of a scanning probe measurement device and in which at least one subsection (1) of the measurement object (2, 12) is optically examined, in an observation region associated with an optical measurement system, using the optical measurement system, wherein displacement of the at least one subsection (1) of the measurement object (2, 12) from the observation region, said displacement being caused by the examination by means of scanning probe microscopy, is corrected in such a manner that the at least one displaced subsection (1) of the measurement object (2, 12) is arranged in the observation region again with the aid of an adjusting device which processes data signals which characterize the displacement.

IPC 8 full level

G01Q 60/02 (2010.01); G01Q 10/00 (2010.01); G01Q 10/06 (2010.01); G01Q 30/02 (2010.01); G01Q 30/06 (2010.01); G01Q 60/18 (2010.01)

CPC (source: EP US)

B82Y 35/00 (2013.01 - US); G01Q 10/06 (2013.01 - EP US); G01Q 30/025 (2013.01 - EP US); G01Q 30/06 (2013.01 - EP US)

Citation (search report)

See references of WO 2007041976A1

Designated contracting state (EPC)

DE GB

DOCDB simple family (publication)

WO 2007041976 A1 20070419; CN 101326433 A 20081217; EP 1934578 A1 20080625; JP 2009511882 A 20090319; US 2009205089 A1 20090813; US 8769711 B2 20140701

DOCDB simple family (application)

DE 2006001131 W 20060630; CN 200680046323 A 20060630; EP 06761735 A 20060630; JP 2008534858 A 20060630; US 8330306 A 20060630