EP 1957993 A1 20080820 - CIRCUIT ARRANGEMENT AND METHOD FOR TESTING THE FUNCTION OF A POWER TRANSISTOR
Title (en)
CIRCUIT ARRANGEMENT AND METHOD FOR TESTING THE FUNCTION OF A POWER TRANSISTOR
Title (de)
SCHALTUNGSANORDNUNG UND VERFAHREN ZUR FUNKTIONSÜBERPRÜFUNG EINES LEISTUNGSTRANSISTORS
Title (fr)
CIRCUIT ET PROCEDE POUR CONTROLER LE FONCTIONNEMENT D'UN TRANSISTOR DE PUISSANCE
Publication
Application
Priority
- EP 2006068327 W 20061110
- DE 102005055954 A 20051124
Abstract (en)
[origin: DE102005055954A1] The arrangement has a control device (2) with a signal output that is connected to a gate (G) by a gate-connection contact (3g). A capacitance measuring device (6) measures a gate-connection-capacitance between the gate-connection contact and a power electrode-connection contact (3s). An evaluation device (8) compares the measured gate-connection-capacitance with a gate capacitance (Cg) and outputs an error signal in dependence of the comparison. An independent claim is also included for a method for functional inspection of power transistors.
IPC 8 full level
G01R 31/04 (2006.01)
CPC (source: EP US)
G01R 31/2621 (2013.01 - EP US)
Citation (search report)
See references of WO 2007060098A1
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC NL PL PT RO SE SI SK TR
DOCDB simple family (publication)
DE 102005055954 A1 20070531; EP 1957993 A1 20080820; JP 2009517642 A 20090430; JP 4868548 B2 20120201; TW 200739097 A 20071016; US 2009102504 A1 20090423; US 7932724 B2 20110426; WO 2007060098 A1 20070531
DOCDB simple family (application)
DE 102005055954 A 20051124; EP 06807800 A 20061110; EP 2006068327 W 20061110; JP 2008541687 A 20061110; TW 95143113 A 20061122; US 8430906 A 20061110