EP 1982203 A1 20081022 - Method and device for testing bare circuit boards
Title (en)
Method and device for testing bare circuit boards
Title (de)
Verfahren und Vorrichtung zum Testen von unbestückten Leiterplatten
Title (fr)
Procédé et dispositif pour tester des cartes de circuits imprimés nus
Publication
Application
Priority
- EP 2007000690 W 20070126
- DE 102006005800 A 20060208
Abstract (en)
[origin: US2008272792A1] The method according to the invention is used to determine deviations of circuit board test points of a series of circuit boards from the CAD data relating to these circuit boards, by scanning the surface of the circuit board by an imaging method and subjecting this image to automatic image analysis so that it may be compared with the CAD data. The CAD data are then suitably corrected so that, with the aid of the corrected CAD data, the circuit board may be tested in a finger tester, with test fingers of the finger tester being controlled on the basis of the deviations found.
IPC 8 full level
G01R 31/28 (2006.01); G01R 31/309 (2006.01)
CPC (source: EP KR US)
G01R 1/073 (2013.01 - KR); G01R 31/2805 (2013.01 - EP US); G01R 31/309 (2013.01 - EP US)
Citation (search report)
See references of WO 2007090528A1
Designated contracting state (EPC)
AT CH DE FR IT LI
DOCDB simple family (publication)
US 2008272792 A1 20081106; US 7821278 B2 20101026; AT E535819 T1 20111215; CN 101361005 A 20090204; CN 101361005 B 20120201; DE 102006005800 A1 20070816; DE 102006005800 B4 20071206; EP 1982203 A1 20081022; EP 1982203 B1 20111130; JP 2009524073 A 20090625; JP 5351521 B2 20131127; KR 101154819 B1 20120618; KR 20080093455 A 20081021; TW 200739104 A 20071016; WO 2007090528 A1 20070816
DOCDB simple family (application)
US 9781907 A 20070126; AT 07703071 T 20070126; CN 200780001486 A 20070126; DE 102006005800 A 20060208; EP 07703071 A 20070126; EP 2007000690 W 20070126; JP 2008551730 A 20070126; KR 20087021909 A 20070126; TW 96103078 A 20070126