Global Patent Index - EP 2024729 A1

EP 2024729 A1 2009-02-18 - MEASURING ARRANGEMENT

Title (en)

MEASURING ARRANGEMENT

Title (de)

MESSANORDNUNG

Title (fr)

DISPOSITIF DE MESURE

Publication

EP 2024729 A1 (DE)

Application

EP 07729132 A

Priority

  • EP 2007054680 W
  • EP 06113946 A
  • EP 07729132 A

Abstract (en)

[origin: EP1857808A1] The arrangement has an optical radiation source (9) e.g. infrared radiation source, for generating an optical beam (10), and a crystal (2) that is penetrated by the beam. A sample (4) partially absorbs the radiation of the optical beam, and is arranged at a distance (dm) from the crystal. A spectroscopically inert medium (6) is provided in an inter-space formed between the sample and the crystal, where the medium is penetrated by the radiation of the optical beam. The medium is a fluid such as liquid hydrocarbon, and the crystal consists of diamond, germanium, zinc selenious or silicon. An independent claim is also included for a measuring method of a spectroscopy.

IPC 8 full level (invention and additional information)

G01N 21/35 (2006.01); G01N 21/55 (2006.01)

CPC (invention and additional information)

G01N 21/552 (2013.01); G01N 21/359 (2013.01); G01N 21/3563 (2013.01); G01N 2021/3595 (2013.01)

Citation (search report)

See references of WO 2007131997A1

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC MT NL PL PT RO SE SI SK TR

Designated extension state (EPC)

AL BA HR MK RS

EPO simple patent family

EP 1857808 A1 20071121; EP 2024729 A1 20090218; WO 2007131997 A1 20071122

INPADOC legal status


2013-05-29 [18D] APPLICATION DEEMED TO BE WITHDRAWN

- Effective date: 20121201

2012-08-08 [DAX] REQUEST FOR EXTENSION OF THE EUROPEAN PATENT (TO ANY COUNTRY) (DELETED)

2010-04-21 [17Q] FIRST EXAMINATION REPORT

- Effective date: 20100319

2009-02-18 [17P] REQUEST FOR EXAMINATION FILED

- Effective date: 20080916

2009-02-18 [AK] DESIGNATED CONTRACTING STATES:

- Kind Code of Ref Document: A1

- Designated State(s): AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC MT NL PL PT RO SE SI SK TR

2009-02-18 [AX] REQUEST FOR EXTENSION OF THE EUROPEAN PATENT TO:

- Countries: AL BA HR MK RS