EP 2029998 A1 20090304 - CONTROLLED ATOMIC FORCE MICROSCOPE
Title (en)
CONTROLLED ATOMIC FORCE MICROSCOPE
Title (de)
GESTEUERTES ATOMKRAFTMIKROSKOP
Title (fr)
MICROSCOPE A FORCE ATOMIQUE ASSERVI
Publication
Application
Priority
- FR 2007051319 W 20070523
- FR 0604674 A 20060524
Abstract (en)
[origin: WO2007135345A1] The invention relates to an atomic force microscope comprising a microtip (1) placed on a flexible support connected to a microscope head (11) facing a surface (5) to be studied, which includes means (31, 32) for controlling the distance between said head and said surface for a given value and means (31, 35) for inhibiting vibration of the microtip.
IPC 8 full level
G01Q 10/00 (2010.01); G01Q 10/06 (2010.01); G01Q 30/12 (2010.01); G01Q 60/18 (2010.01); G01Q 60/36 (2010.01); G01Q 70/04 (2010.01)
CPC (source: EP US)
G01Q 10/065 (2013.01 - EP US); G01Q 70/04 (2013.01 - EP US)
Citation (search report)
See references of WO 2007135345A1
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HU IE IS IT LI LT LU LV MC MT NL PL PT RO SE SI SK TR
Designated extension state (EPC)
AL BA HR MK RS
DOCDB simple family (publication)
WO 2007135345 A1 20071129; AU 2007253164 A1 20071129; CA 2653116 A1 20071129; EP 2029998 A1 20090304; FR 2901601 A1 20071130; FR 2901601 B1 20081219; JP 2009537840 A 20091029; US 2010064397 A1 20100311
DOCDB simple family (application)
FR 2007051319 W 20070523; AU 2007253164 A 20070523; CA 2653116 A 20070523; EP 07766092 A 20070523; FR 0604674 A 20060524; JP 2009511560 A 20070523; US 30216007 A 20070523