Global Patent Index - EP 2143810 A4

EP 2143810 A4 20120627 - COPPER ALLOY FOR ELECTRICAL/ELECTRONIC DEVICE AND METHOD FOR PRODUCING THE SAME

Title (en)

COPPER ALLOY FOR ELECTRICAL/ELECTRONIC DEVICE AND METHOD FOR PRODUCING THE SAME

Title (de)

KUPFERLEGIERUNG FÜR ELEKTRISCHE/ELEKTRONISCHE VORRICHTUNG UND HERSTELLUNGSVERFAHREN DAFÜR

Title (fr)

ALLIAGE DE CUIVRE POUR UN DISPOSITIF ÉLECTRIQUE/ÉLECTRONIQUE ET SON PROCÉDÉ DE FABRICATION

Publication

EP 2143810 A4 20120627 (EN)

Application

EP 08722882 A 20080326

Priority

  • JP 2008055785 W 20080326
  • JP 2007080266 A 20070326
  • JP 2008079256 A 20080325

Abstract (en)

[origin: EP2143810A1] A copper alloy for an electrical and electronic device in accordance with the present invention is characterized in that the copper alloy for an electrical and electronic device includes: nickel (Ni) between 1.5 mass% and 5.0 mass%; silicon (Si) between 0.4 mass% and 1.5 mass%; and a remaining portion formed of Cu and an unavoidable impurity, wherein a mass ratio between Nickel (Ni) and Silicon (Si) as Ni/Si is not smaller than two and not larger than seven, an average crystalline grain diameter is not smaller than 2 µm and not larger than 20 µm, and a standard deviation of the crystalline grain diameter is not larger than 10 µm.

IPC 8 full level

C22C 9/06 (2006.01); B03C 5/00 (2006.01); C22F 1/00 (2006.01); C22F 1/08 (2006.01)

CPC (source: EP US)

B03C 5/005 (2013.01 - EP US); B03C 5/022 (2013.01 - EP US); C22C 9/00 (2013.01 - EP US); C22C 9/06 (2013.01 - EP US); C22F 1/00 (2013.01 - EP US); C22F 1/08 (2013.01 - EP US); H01R 13/03 (2013.01 - EP US)

Citation (search report)

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL PT RO SE SI SK TR

DOCDB simple family (publication)

EP 2143810 A1 20100113; EP 2143810 A4 20120627; CN 101680057 A 20100324; JP 2008266783 A 20081106; JP 5170881 B2 20130327; US 2010193092 A1 20100805; WO 2008126681 A1 20081023

DOCDB simple family (application)

EP 08722882 A 20080326; CN 200880017586 A 20080326; JP 2008055785 W 20080326; JP 2008079256 A 20080325; US 59302408 A 20080326