EP 2153207 A1 20100217 - METHOD AND DEVICE FOR ALIGNING A TEST SYSTEM AND AN ELECTRIC MEMBER TO BE TESTED
Title (en)
METHOD AND DEVICE FOR ALIGNING A TEST SYSTEM AND AN ELECTRIC MEMBER TO BE TESTED
Title (de)
VERFAHREN UND VORRICHTUNG ZUR ANGLEICHUNG EINES TESTSYSTEMS UND EINES ZU TESTENDEN ELEKTRISCHEN GLIEDS
Title (fr)
PROCEDE ET DISPOSITIF D'ALIGNEMENT D'UN SYSTEME DE TEST AVEC UN ELEMENT ELECTRIQUE A TESTER
Publication
Application
Priority
- IB 2008001023 W 20080418
- FR 0703270 A 20070507
Abstract (en)
[origin: WO2008135821A1] The invention relates to a method for locating an electrically conductive member (5c) at the surface of a circuit (5), the method comprising the steps of: placing the circuit in a device for testing or measuring electrically conductive members, said device comprising at least one source (1a) of a light beam (2) and a control unit (CNTL) for applying the light beam to several impact points at the surface of the circuit; applying the light beam (2) to several impact points at the surface of the circuit (5) in order to generate at the surface of the circuit a particle flow having a detectable intensity depending on the nature of the material at the impact point of the light beam; comparing the intensity variations of the light beam generated at each impact point; and deriving the position of the conductive member at the surface of the circuit. The invention can be used for precisely locating a circuit in a test device using the photoelectric effect.
IPC 8 full level
G01N 21/64 (2006.01); G01R 31/28 (2006.01); G01R 31/308 (2006.01); H05K 13/08 (2006.01)
CPC (source: EP)
G01N 21/6489 (2013.01); G01N 21/956 (2013.01); G01R 31/2813 (2013.01); G01R 31/308 (2013.01)
Citation (search report)
See references of WO 2008135821A1
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL PT RO SE SI SK TR
Designated extension state (EPC)
AL BA MK RS
DOCDB simple family (publication)
FR 2916051 A1 20081114; EP 2153207 A1 20100217; JP 2010526314 A 20100729; TW 200905225 A 20090201; WO 2008135821 A1 20081113
DOCDB simple family (application)
FR 0703270 A 20070507; EP 08737536 A 20080418; IB 2008001023 W 20080418; JP 2010507012 A 20080418; TW 97115110 A 20080424