Global Patent Index - EP 2158496 A2

EP 2158496 A2 20100303 - METHOD AND DEVICE FOR MEASURING MAGNETIC FIELDS

Title (en)

METHOD AND DEVICE FOR MEASURING MAGNETIC FIELDS

Title (de)

VERFAHREN UND VORRICHTUNG ZUM MESSEN VON MAGNETFELDERN

Title (fr)

PROCÉDÉ ET DISPOSITIF DE MESURE DE CHAMPS MAGNÉTIQUES

Publication

EP 2158496 A2 (DE)

Application

EP 08756818 A

Priority

  • AT 2008000208 W
  • AT 9322007 A

Abstract (en)

[origin: WO2008151344A2] The invention relates to a method which makes use of the Zeeman effect for measuring magnetic fields, by way of dark resonances. According to said method, a measuring cell (14) is exposed to the magnetic field (B) to be measured and contains the atoms of a measuring medium in a buffer gas, a radiation source (11) being provided for exciting the atoms by radiation and being connected to the modulation frequency generator and emitting electromagnetic radiation with different frequencies. A frequency detector (17) is mounted downstream of the measuring cell (14) and comprises a control loop (18) for the frequency tuning to a dark resonance frequency. The invention is characterized in that at least one modulator (22) for modulating a comparatively high first modulation frequency with a lower second modulation frequency, thereby producing a double sideband structure, is mounted downstream of the modulation frequency generator (24) to couple a plurality of dark resonances using the electromagnetic radiation (12) modulated therewith, substantially only one frequency being detected according to the magnetic field-dependent frequency shift.

IPC 8 full level

G01R 33/032 (2006.01); G01R 33/26 (2006.01)

CPC (source: EP)

G01R 33/032 (2013.01); G01R 33/26 (2013.01)

Citation (search report)

See references of WO 2008151344A2

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL PT RO SE SI SK TR

Designated extension state (EPC)

AL BA MK RS

DOCDB simple family (publication)

WO 2008151344 A2 20081218; WO 2008151344 A3 20090212; AT 505470 A1 20090115; AT 505470 B1 20100915; CA 2689964 A1 20081218; EP 2158496 A2 20100303; US 2010188081 A1 20100729

DOCDB simple family (application)

AT 2008000208 W 20080612; AT 9322007 A 20070615; CA 2689964 A 20080612; EP 08756818 A 20080612; US 66478208 A 20080612