Global Patent Index - EP 2173015 B1

EP 2173015 B1 20170503 - Method for calculating the quality of a crimp connection between a conductor and a contact

Title (en)

Method for calculating the quality of a crimp connection between a conductor and a contact

Title (de)

Verfahren zur Bestimmung der Qualität einer Crimpverbindung zwischen einem Leiter und einem Kontakt

Title (fr)

Procédé de détermination de la qualité d'une connexion réalisée par sertissage entre un conducteur et un contact

Publication

EP 2173015 B1 20170503 (DE)

Application

EP 09172082 A 20091002

Priority

  • EP 08165675 A 20081002
  • EP 09172082 A 20091002

Abstract (en)

[origin: EP2173015A1] The method involves exerting a crimping force on a conductor and a contact by a crimping device. A crimping force curve (C1) resulting during crimping is determined, and a compression surface lying below a reference crimping force curve (R) is determined. The crimping force curve and the reference crimping force curve are divided into multiple zones (Ziso, Zmc) based on a variable of the compression surface. A surface (deltafiso) lying below the crimping force curve is determined, where the surface is a measure for quality of a crimping connection. An independent claim is also included for a crimping device.

IPC 8 full level

H01R 43/048 (2006.01)

CPC (source: EP US)

H01R 43/0486 (2013.01 - EP US); Y10T 29/53022 (2015.01 - US); Y10T 29/53235 (2015.01 - US)

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR

DOCDB simple family (publication)

EP 2173015 A1 20100407; EP 2173015 B1 20170503; CN 101713648 A 20100526; CN 101713648 B 20130508; US 2010139351 A1 20100610; US 8746026 B2 20140610

DOCDB simple family (application)

EP 09172082 A 20091002; CN 200910178541 A 20090927; US 55666109 A 20090910