EP 2220480 A2 20100825 - HIGH-RESOLUTION SURFACE PLASMON MICROSCOPE WITH HETERODYNE INTERFEROMETRY IN RADIAL POLARIZATION MODE
Title (en)
HIGH-RESOLUTION SURFACE PLASMON MICROSCOPE WITH HETERODYNE INTERFEROMETRY IN RADIAL POLARIZATION MODE
Title (de)
HOCHAUFLÖSENDES OBERFLÄCHENPLASMONENMIKROSKOP MIT HETERODYNER INTERFEROMETRIE IM RADIALEN POLARISATIONSMODUS
Title (fr)
MICROSCOPE A PLASMON DE SURFACE A HAUTE RESOLUTION AVEC INTERFEROMETRE HETERODYNE EN POLARISATION RADIALE
Publication
Application
Priority
- FR 2008052279 W 20081211
- FR 0759716 A 20071211
Abstract (en)
[origin: WO2009080998A2] The present invention relates to a high-resolution scanning surface-plasmon microscope, comprising a coherent light source (LG) and a medium for coupling and confining a surface plasmon, comprising an objective (O, 0M) of large numerical aperture, an immersion oil (Hi) and a glass slide (Gs). A metal layer (Ms) covers one surface of the glass slide (Gs). The microscope also includes a Twyman-Green interferometer operating in heterodyne mode, this being placed between the light source and the coupling medium, and also means (PL1, PL2, EC) for scanning the metal layer using a light beam, and means (PD) for detecting the beam output by the interferometer, said means being connected to means (S, F, DTec, COMP) for processing and forming an image from this beam. In accordance with the invention, at least one polarization converter (CP), for converting a linear polarization of the light beams (L) emitted by the light source (LG) into a radial polarization, is placed between the light source and the interferometer.
IPC 1-7
IPC 8 full level
G01N 21/55 (2006.01); G01B 9/02 (2006.01); G01B 9/04 (2006.01); G02B 21/00 (2006.01)
CPC (source: EP US)
G01B 9/04 (2013.01 - EP US); G01N 21/553 (2013.01 - EP US); B82Y 20/00 (2013.01 - EP US); B82Y 35/00 (2013.01 - EP US); G01N 2201/067 (2013.01 - EP US)
Citation (search report)
See references of WO 2009080998A2
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL PT RO SE SI SK TR
Designated extension state (EPC)
AL BA MK RS
DOCDB simple family (publication)
FR 2924805 A1 20090612; FR 2924805 B1 20110506; EP 2220480 A2 20100825; US 2010328674 A1 20101230; US 8610897 B2 20131217; WO 2009080998 A2 20090702; WO 2009080998 A3 20090820
DOCDB simple family (application)
FR 0759716 A 20071211; EP 08865044 A 20081211; FR 2008052279 W 20081211; US 74726608 A 20081211