EP 2241899 A4 20171011 - MEASUREMENT ERROR CORRECTING METHOD AND ELECTRONIC PART CHARACTERISTIC MEASURING INSTRUMENT
Title (en)
MEASUREMENT ERROR CORRECTING METHOD AND ELECTRONIC PART CHARACTERISTIC MEASURING INSTRUMENT
Title (de)
MESSFEHLERKORREKTURVERFAHREN UND INSTRUMENT ZUR MESSUNG DER EIGENSCHAFTEN VON ELEKTRONIKTEILEN
Title (fr)
PROCÉDÉ DE CORRECTION D'ERREUR DE MESURE ET INSTRUMENT DE MESURE DE CARACTÉRISTIQUE DE COMPOSANT ÉLECTRONIQUE
Publication
Application
Priority
- JP 2008072236 W 20081208
- JP 2008025778 A 20080205
Abstract (en)
[origin: EP2241899A1] Provided are a method for correcting measurement errors and an electronic component characteristics measurement device that can improve the correction precision by eliminating the correction errors caused by leakage signal components between the ports of the measurement jigs. An equation CA ij that correlates measurement values in a test measurement jig mounted state with measurement values in a standard measurement jig mounted state is determined from a result of measuring electric characteristics S D , S T on correction data obtaining samples having different electric characteristics with each other in a state in which they are mounted on a standard measurement jig 20 and on a test measurement jig 30. The equation CA ij is an equation that assumes presence of leakage signals that are directly transmitted between at least two ports of at least one of the standard measurement jig and the test measurement jig. By using the equation CA ij determined by measuring the electric characteristics on an arbitrary electronic component in a state in which it is mounted on the test measurement jig 30, the electric characteristics that would be obtained if measured on the electronic component in a state in which it is mounted on the standard measurement jig 20 are calculated.
IPC 8 full level
G01R 27/28 (2006.01); G01R 35/00 (2006.01)
CPC (source: EP US)
G01R 27/28 (2013.01 - EP US); G01R 35/005 (2013.01 - EP US)
Citation (search report)
- [I] US 2007084035 A1 20070419 - MORI TAICHI [JP], et al
- [A] US 6697749 B2 20040224 - KAMITANI GAKU [JP]
- [A] JOHN V BUTLER ET AL: "16-Term Error Model and Calibration Procedure for On-Wafer Network Analysis Measurements", 31 December 1991 (1991-12-31), XP055394185, Retrieved from the Internet <URL:http://ieeexplore.ieee.org/ielx1/22/3252/00106567.pdf?tp=&arnumber=106567&isnumber=3252> [retrieved on 20170727]
- [A] "Application Note 1364-1 Agilent De-embedding and Embedding S-Parameter Networks Using a Vector Network Analyzer", 30 May 2004 (2004-05-30), XP055106311, Retrieved from the Internet <URL:http://cp.literature.agilent.com/litweb/pdf/5980-2784EN.pdf> [retrieved on 20140307]
- [A] K. SILVONEN: "LMR 16-a self-calibration procedure for a leaky network analyzer", IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES., vol. 45, no. 7, 31 July 1997 (1997-07-31), US, pages 1041 - 1049, XP055394182, ISSN: 0018-9480, DOI: 10.1109/22.598439
- See references of WO 2009098816A1
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MT NL NO PL PT RO SE SI SK TR
DOCDB simple family (publication)
EP 2241899 A1 20101020; EP 2241899 A4 20171011; CN 101932942 A 20101229; CN 101932942 B 20140129; JP 5246172 B2 20130724; JP WO2009098816 A1 20110526; KR 101152046 B1 20120703; KR 20100107490 A 20101005; TW 200938855 A 20090916; TW I438450 B 20140521; US 2011178751 A1 20110721; US 8688395 B2 20140401; WO 2009098816 A1 20090813
DOCDB simple family (application)
EP 08872059 A 20081208; CN 200880126131 A 20081208; JP 2008072236 W 20081208; JP 2009552386 A 20081208; KR 20107017109 A 20081208; TW 98100592 A 20090109; US 84903710 A 20100803