Global Patent Index - EP 2255174 A1

EP 2255174 A1 20101201 - SYSTEM AND METHOD FOR DETERMINING A REFRACTIVE INDEX OF A MEASURED OBJECT

Title (en)

SYSTEM AND METHOD FOR DETERMINING A REFRACTIVE INDEX OF A MEASURED OBJECT

Title (de)

SYSTEM UND VERFAHREN ZUR BESTIMMUNG EINER BRECHZAHL EINES MESSOBJEKTS

Title (fr)

SYSTÈME ET PROCÉDÉ POUR DÉTERMINER UN INDICE DE RÉFRACTION D'UN OBJET MESURÉ

Publication

EP 2255174 A1 20101201 (DE)

Application

EP 09721047 A 20090316

Priority

  • EP 2009001893 W 20090316
  • DE 102008014335 A 20080314

Abstract (en)

[origin: WO2009112288A1] A system (30) for determining an index of refraction (n (object)) of a measured object (31), comprising a light source (32) for issuing light (33) of a pre-defined wavelength, an integrated sensor element (35) with an optoelectronic sensor (36) and a layered structure (37) with at least one structured metal layer (44) wherein the optoelectronic sensor (36) and the layered structure (37) are commonly integrated on a semiconductor substrate (38), a device (39) for holding the measured object (31) between the integrated sensor element (35) and the light source (32) so that the layered structure (37) is disposed between the measured object (31) and the optoelectronic sensor (36), and so that an output signal from the optoelectronic sensor (36) to the light (33) with the pre-defined wavelength changes depending on the index of refraction (n(object)) of the measured object (31), and a device (40) for determining the index of refraction (n(object)) of the measured object (31) based on the output signal of the optoelectronic sensor (36).

IPC 8 full level

G01N 21/41 (2006.01); B82Y 20/00 (2011.01); G01N 21/552 (2014.01); G02B 1/00 (2006.01); G02B 5/00 (2006.01); G02B 6/122 (2006.01); G02B 5/18 (2006.01); G02B 5/20 (2006.01)

CPC (source: EP)

B82Y 20/00 (2013.01); G01N 21/4133 (2013.01); G01N 21/554 (2013.01); G02B 1/005 (2013.01); G02B 5/008 (2013.01); G02B 6/1226 (2013.01); G01N 2021/414 (2013.01); G02B 5/1809 (2013.01); G02B 5/201 (2013.01)

Citation (search report)

See references of WO 2009112288A1

Citation (examination)

Designated contracting state (EPC)

AT BE BG CH CY CZ DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK TR

Designated extension state (EPC)

AL BA RS

DOCDB simple family (publication)

WO 2009112288 A1 20090917; DE 102008014335 A1 20090924; DE 102008014335 B4 20091217; EP 2255174 A1 20101201

DOCDB simple family (application)

EP 2009001893 W 20090316; DE 102008014335 A 20080314; EP 09721047 A 20090316