Global Patent Index - EP 2269039 A1

EP 2269039 A1 20110105 - DEVICE AND METHOD FOR ENHANCED ANALYSIS OF PARTICLE SAMPLE

Title (en)

DEVICE AND METHOD FOR ENHANCED ANALYSIS OF PARTICLE SAMPLE

Title (de)

VORRICHTUNG UND VERFAHREN ZUR ERWEITERTEN ANALYSE EINER PARTIKELPROBE

Title (fr)

DISPOSITIF ET PROCÉDÉ D'ANALYSE EXALTÉE D'UN ÉCHANTILLON DE PARTICULES

Publication

EP 2269039 A1 20110105 (FR)

Application

EP 09738336 A 20090414

Priority

  • FR 2009000432 W 20090414
  • FR 0852487 A 20080414

Abstract (en)

[origin: WO2009133302A1] The present invention relates to a device for analyzing a dissolved particle sample (2), said device comprising a microscope system (1), said microscope system (1) comprising a supporting means (3) for supporting said sample (2), an illumination means (4) capable of emitting a luminous energizing beam (10), a focusing means (5) for focusing said luminous energizing beam (10) into a focal point (12) on the sample (2), and a spatial filter means (7) capable of defining an analyzed space (13) around the focal point (12), and is characterized in that said microscope system (1) also comprises an enhancement means (14) for enhancing said luminous energizing beam (10), said enhancement means (14) having a strictly positive focal length and a refractive index greater than the refractive index of said sample (2), one portion of said enhancement means (14) being disposed on the path of said luminous energizing beam (10) downstream from said supporting means (3) and upstream from said focal point (12), and in that at least one portion (14") of said enhancement means (14) is not rigidly connected to the supporting means (3). The present invention also relates to a method for analyzing a dissolved particle sample (2) by such an analyzing device.

IPC 8 full level

G01N 21/64 (2006.01)

CPC (source: EP US)

G01N 21/6458 (2013.01 - EP US); G01N 2021/6417 (2013.01 - EP US); G01N 2021/6421 (2013.01 - EP US)

Citation (search report)

See references of WO 2009133302A1

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK TR

Designated extension state (EPC)

AL BA RS

DOCDB simple family (publication)

FR 2930031 A1 20091016; EP 2269039 A1 20110105; JP 2011521276 A 20110721; US 2011147613 A1 20110623; WO 2009133302 A1 20091105

DOCDB simple family (application)

FR 0852487 A 20080414; EP 09738336 A 20090414; FR 2009000432 W 20090414; JP 2011504497 A 20090414; US 93793709 A 20090414