Global Patent Index - EP 2344732 A1

EP 2344732 A1 20110720 - SYSTEM AND METHOD FOR MEASURING RETENTATE IN FILTERS

Title (en)

SYSTEM AND METHOD FOR MEASURING RETENTATE IN FILTERS

Title (de)

SYSTEM UND VERFAHREN ZUM MESSEN VON RETENTAT IN FILTERN

Title (fr)

SYSTEME ET PROCEDE DE MESURE DU RETENTAT DANS DES FILTRES

Publication

EP 2344732 A1 20110720 (EN)

Application

EP 09835426 A 20091030

Priority

  • US 2009062782 W 20091030
  • US 11096508 P 20081103

Abstract (en)

[origin: WO2010074812A1] A system and method for determining loading of a filter having a first dielectric constant with a material having a different dielectric constant, is disclosed. The filter is contained within a metallic container forming a microwave cavity, and microwave or RF energy is created within the cavity and changes in the cavity microwave response are monitored. The changes in cavity microwave response are related to filter loading. In a preferred embodiment, the microwave energy includes multiple cavity modes thereby allowing determination of spatial distribution of the contaminant material loading. In one embodiment, the microwave cavity response includes a shift in frequency of a resonant mode. Alternatively, the microwave cavity response includes a shift in quality factor Q of a resonant mode. The microwave cavity response may include a shift in amplitude or peak width of the microwave's signal at resonance.

IPC 8 full level

F01N 3/00 (2006.01)

CPC (source: EP)

F01N 9/002 (2013.01); G01N 15/0618 (2013.01); F01N 2560/05 (2013.01); F01N 2560/12 (2013.01); F01N 2560/14 (2013.01); G01N 22/00 (2013.01); G01N 2015/0046 (2013.01); Y02T 10/40 (2013.01)

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR

Designated extension state (EPC)

AL BA RS

DOCDB simple family (publication)

WO 2010074812 A1 20100701; CN 102203392 A 20110928; CN 102203392 B 20150513; EP 2344732 A1 20110720; EP 2344732 A4 20170712; JP 2012507660 A 20120329; JP 5628818 B2 20141119

DOCDB simple family (application)

US 2009062782 W 20091030; CN 200980143806 A 20091030; EP 09835426 A 20091030; JP 2011534811 A 20091030