Global Patent Index - EP 2391954 A1

EP 2391954 A1 20111207 - STITCH QUALITY MONITORING SYSTEM

Title (en)

STITCH QUALITY MONITORING SYSTEM

Title (de)

SYSTEM ZUR ÜBERWACHUNG DER QUALITÄT VON EINSTICHEN

Title (fr)

SYSTÈME DE CONTRÔLE DE LA QUALITÉ DE COUTURE

Publication

EP 2391954 A1 20111207 (EN)

Application

EP 10736328 A 20100127

Priority

  • US 2010022198 W 20100127
  • US 14751709 P 20090127

Abstract (en)

[origin: US2010186646A1] A stitcher is provided that includes a needle configured to place stitches in a fabric that is moved therethrough. The stitcher includes a sensor positioned below the fabric to monitor stitches placed in the fabric. A microcontroller is provided configured to receive data from the sensor and, based on such data, to compare one or more attributes of the monitored stitches with one or more predetermined parameters relating at least one attribute of the fabric. The predetermined parameter may be either hardcoded inn the microcontroller or input by a user of the stitcher prior to beginning operation of the machine. When the attributes of the monitored stitches fall outside of the predetermined parameters, the microcontroller initiates notification of the user.

IPC 8 full level

G06F 17/00 (2006.01)

CPC (source: EP US)

D05B 19/12 (2013.01 - EP US); D05B 69/36 (2013.01 - EP US)

Citation (search report)

See references of WO 2010088253A1

Designated contracting state (EPC)

AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR

DOCDB simple family (publication)

US 2010186646 A1 20100729; AU 2010208366 A1 20110818; EP 2391954 A1 20111207; WO 2010088253 A1 20100805

DOCDB simple family (application)

US 69466710 A 20100127; AU 2010208366 A 20100127; EP 10736328 A 20100127; US 2010022198 W 20100127