EP 2396806 B1 20150429 - MASS ANALYSIS DEVICE WITH WIDE ANGULAR ACCEPTANCE INCLUDING A REFLECTRON
Title (en)
MASS ANALYSIS DEVICE WITH WIDE ANGULAR ACCEPTANCE INCLUDING A REFLECTRON
Title (de)
MASSENANALYSEEINRICHTUNG MIT GROSSER WINKELANNAHMEFÄHIGKEIT MIT EINEM REFLEKTRON
Title (fr)
DISPOSITIF D'ANALYSE DE MASSE A LARGE ACCEPTANCE ANGULAIRE COMPRENANT UN REFLECTRON
Publication
Application
Priority
- EP 2010051764 W 20100212
- FR 0950955 A 20090213
Abstract (en)
[origin: WO2010092141A1] The invention relates to a mass analysis device (100) with wide angular acceptance, in particular such as a mass spectrometer or an atom probe microscope, including a means for receiving a sample (101), a means for extracting ions from the surface of the sample (101), and a reflectron (103) producing a toroidal electrostatic field in which the equipotential lines are defined by a first curvature in a first direction and a first centre of curvature (105), and a second curvature in a second direction perpendicular to the first direction and a second centre of curvature, characterised in that the sample (101) is placed adjacent to the first centre of curvature (105).
IPC 8 full level
H01J 49/40 (2006.01)
CPC (source: EP US)
H01J 49/0004 (2013.01 - EP US); H01J 49/405 (2013.01 - EP US)
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR
DOCDB simple family (publication)
WO 2010092141 A1 20100819; EP 2396806 A1 20111221; EP 2396806 B1 20150429; FR 2942349 A1 20100820; FR 2942349 B1 20120427; JP 2012518246 A 20120809; US 2011303841 A1 20111215; US 8502139 B2 20130806
DOCDB simple family (application)
EP 2010051764 W 20100212; EP 10703478 A 20100212; FR 0950955 A 20090213; JP 2011549575 A 20100212; US 201013201323 A 20100212