EP 2425205 B1 20130828 - APPARATUS AND METHOD FOR MEASURING MATERIAL THICKNESS
Title (en)
APPARATUS AND METHOD FOR MEASURING MATERIAL THICKNESS
Title (de)
VORRICHTUNG UND SYSTEM ZUR MATERIALDICKEMESSUNG
Title (fr)
APPAREIL ET SYSTÈME POUR MESURER L'ÉPAISSEUR DE MATÉRIAU
Publication
Application
Priority
- US 2010030106 W 20100406
- US 43435709 A 20090501
Abstract (en)
[origin: US2010275692A1] An apparatus and system for measuring material thickness of a test object. In one embodiment, the apparatus can include a measurement probe that can have a plurality of transducer elements that can include transmitter elements and receiver elements arranged, respectively, in on a first side and a second side of a gap. The first side and the second side can form a scan area with at least one active group that can have at least one transmitter element and at least one receiver element, which can be separated from the transmitter element in a spaced relationship.
IPC 8 full level
G01B 17/02 (2006.01); B06B 1/00 (2006.01); G01N 29/22 (2006.01)
CPC (source: EP US)
B06B 1/0629 (2013.01 - EP US); G01B 17/02 (2013.01 - EP US); G01N 29/221 (2013.01 - EP US); G01N 2291/106 (2013.01 - EP US)
Designated contracting state (EPC)
AT BE BG CH CY CZ DE DK EE ES FI FR GB GR HR HU IE IS IT LI LT LU LV MC MK MT NL NO PL PT RO SE SI SK SM TR
DOCDB simple family (publication)
US 2010275692 A1 20101104; US 8286488 B2 20121016; CA 2759472 A1 20101104; CA 2759472 C 20150707; CN 102422123 A 20120418; CN 102422123 B 20180112; EP 2425205 A1 20120307; EP 2425205 B1 20130828; WO 2010126682 A1 20101104
DOCDB simple family (application)
US 43435709 A 20090501; CA 2759472 A 20100406; CN 201080020122 A 20100406; EP 10712305 A 20100406; US 2010030106 W 20100406